Furnish charge measurement

Microelectrophoresis (electrophoretic mobility) . This involves the measurement of particle charge in an applied field. For paper furnishes, the supernatant solution—which contains finely divided colloidal matter, is usually removed and used to conduct the measurement. It must be questioned therefore as to how reflective this is of the charge characteristics of the larger particles and fibres which settle. However, as it is the colloidal fraction which requires to be flocculated to assist retention during drainage, it is still a useful measurement. 

X-ray absorption furnishes an absolute measure of the density of matter. However, in many applications the important observations to be made with X-rays concern the geometrical relationships of shock fronts and contact surfaces it is in this area where X-rays, because they make it possible to sefe inside the detonating expl, provide a uniquely appropriate tool. Until recently the difficulty has been the inability of available sources to penetrate charges more than a few inches in diameter. With the advent of the PHERMEX machine this difficulty has been overcome. Phermex provides a pulsed beam of 27 Me V electrons in 0.1 microsec bursts, which impinge on a tungsten target to generate X-rays that can easily penetrate several cm of HE. Recall that density of the shocked material can be related to particle velocity thru the conservation equations (see Vol 7, HI 79)... 

Probably the most apparent result of the low electron density is the decisive role played by impurities in the semiconductor. Impurities in a semiconductor electrode, even at levels as low as 1 part in 10 , can contribute significantly to the space charge, can act as catalysts for the recombination of holes and electrons, or can furnish additional charge-transfer paths for electrochemical reaction. It is essential, therefore, to have control and knowledge of the impurity distribution before any meaningful kinetic measurements can be made on a semiconductor electrode. 

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