FT-IR Imaging and Microscopy

FIGURE 13.5 Diagram from a Varian training presentation by Dr. Ellen Miseo, senior FTIR scientist of the Varian Analytical Division. This shows a typical interferogram from the detector and the use of a secondary signal from a He-Ne laser (6328 A, red) for internal calibration. 

FIGURE 13.6 Three examples of how the Fourier transform converts a wave signal to a representation of the frequencies present in the wave signal. A single frequency produces only one line, a superposition of two waves produces two frequencies and a compUcated interferogram produces a frequency spectrum. (From Dr. EUen Miseo, senior FT-IR scientist, Varian Analytical Division. With permission.) 

FIGURE 13.7 Up to 4096 pixels (picture elements) with 5.5 micron (1 micron = 10 cm) resolution can be processed simultaneously in 10 min with a patented Varian Focal Plane Array Detector, U.S. Patent No. 6,141,100. (From John C. Hahn, senior spectroscopy specialist, Varian, Inc. With permission.) 

FIGURE 13.9 A schematic diagram showing the way in which the P, Q, and R features of the vib-rotor spectrum occur due to the selection rules for vibrational and rotational transitions. The symbol marked as V refers to the wavenumber scale as v in cm . The Q-branch is missing because the rotational selection rule is that Ay = 1 but Ay = 0 for the g-branch. 

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