Frustrated total reflection

As a major branch of nanotribology. Thin Film Lubrication (TFL) has drawn great concerns. The lubricant him of TFL, which exists in ultra precision instruments or machines, usually ranges from a few to tens of nanometres thick under the condition of point or line contacts with heavy load, high temperature, low speed, and low viscosity lubricant. One of the problems of TFL study is to measure the him thickness quickly and accurately. The optical method for measuring the lubricant him thickness has been widely used for many years. Goher and Cameron [3] successfully used the technique of interferometry to measure elastohydrody-namic lubrication him in the range from 100 nm to 1 /rm in 1967. Now the optical interference method and Frustrated Total Reflection (FTR) technique can measure the him thickness of nm order. 

In Section 2.4, we describe the principle of the Frustrated Total Reflection (FTR) Technique, which was hrst applied by Professor Wen s group at State Key Laboratory of Tribology, Tsinghua University, for measuring him thickness in mixed lubrication [6,7]. 

Otto, A. (1968) Excitation of Nonradiative Surface Plasma Waves in Silver by Method of Frustrated Total Reflection. Zeitschrift fur Physikalische 216 398-410. 

Otto A, Excitation of surface plasma waves in silver by the method of frustrated total reflection, Z. Phys. 1968 216 398-410. 

Fig. 5.17a,b. Two examples of possible ring resonators, using total reflection (a) with corner-cube prism reflectors and frustrated total reflection for output coupling (b) three-mirror arrangement with beam-combining prism... 

Another interesting variant of the total reflection technique is the so-called Surface Electromagnetic Wave Spectroscopy (SEWS), which consists of the generation of a surface plasmon on a substrate by frustrated total internal reflection in a prism located a few microns from the surface. This plasmon is decoupled by a second prism. Some interesting data relating to surface modes on alumina have been reported with this technique [30]. 

The form of the Fresnel equations is deceptively simple. They encapsulate the different reflectivity in the p and s planes referred to, but also describe such phenomena as internal reflection, where the refractive index of the incident medium is higher than that of the substrate, and total and frustrated total internal reflection. 

Harrick N J 1960 Physics and chemistry of surfaces from frustrated total internal reflections Phys. Rev. Lett. 4 224-6... 

FTIR Fourier transform infrared frustrated total internal reflection... 

The Raman scattering is known as a powerful tool for investigation of the SPP and IPP modes. It is more direct method to study these modes than the frustrated total internal reflection (FTIR) [3], initially used for the purpose, as far as the Raman spectra are measured for undisturbed surfaces and can be much easier interpreted. 

ON THE CHOICE OF THE OPTIMUM CONDITIONS FOR THE PRODUCTION OF SPECTRA BY THE FRUSTRATED TOTAL INTERNAL REFLECTION METHOD. 

ON THE CHOICE OF THE OPTIMUM CONDITIONS FOR THE PRODUCTION OF SPECTRA BY THE FRUSTRATED TOTAL INTERNAL REFLECTION METHOD. //ENGLISH TRANSLATION OF OPTIKA I SPEKTROSKOPIYA 19/4/ 623-7,1965.//... 

The Infrared Internal Reflectance Approach An interesting alternative method of minimizing the solution path-length is to employ internal reflectance or attenuated total reflectance (ATR) and this was the approach adopted by the authors of the first report on the acquisition of in situ infrared spectra Mark and Pons [39] employed the ATR approach, [or, as they termed it, frustrated multiple internal reflection (MIR)-see below], to... 

Kharchenko S B, McGuiggan P M, Migler K B, Flow Induced Coating of Fluoropolymer Additives Development of Frustrated Total Internal Reflection Imaging, J. Rheol, 2003 in press. 

ATR has been found as an easy to use, non-destmctive and surface-sensitive IR sampling technique for the in situ investigation of CMP processes (Hind et al., 2001). It was initially pushed by Harrick (1967) and comprehensively treated in his early book and following editions together with Mirabella (1985). Numerous alternative and partially deceptive names are used instead of ATR spectroscopy internal reflection spectroscopy, evanescent wave spectroscopy, frustrated total internal reflection (FTIR, which should not to be confused with Fourier-transform infrared spectroscopy) and multiple internal reflection (MIR, which should not to be confused with mid-infrared )- Therefore, in the following the term ATR as defined in Section 14.4.1 and illustrated with Figure 14.8 is used exclusively. 

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