Fragment effect, secondary

The advantages of SIMS are its high sensitivity (detection limit of ppms for certain elements), its ability to detect hydrogen and the emission of molecular fragments that often bear tractable relationships with the parent structure on the surface. Disadvantages are that secondary ion formation is a poorly understood phenomenon and that quantification is often difficult. A major drawback is the matrix effect secondary ion yields of one element can vary tremendously with chemical environment. This matrix effect and the elemental sensitivity variation of five orders of magmtude across the periodic table make quantitative interpretation of SIMS spectra oftechmcal catalysts extremely difficult. 

What has become one of the hallmarks of suicide attack is deliberate inclusion of material for its fragmentation effect. Nuts, nails and ball bearings are all typical of the readily available arsenal of the bomb-maker and cause a great deal of the secondary injury seen in these attacks. 

The nature of the secondary reactions is uncertain. Some beheve that the primary tar components are broken down to small free radicals that recombine as they travel toward the retort exit others suggest that some components remain relatively intact except for the removal of peripheral substituent groups and that the higher molecular weight components of coal tar are, in effect, slightly altered fragments of the original coal stmcture. 

Rh(Por)l (Por = OEP. TPP, TMP) also acts as a catalyst for the insertion of carbene fragments into the O—H bonds of alcohols, again using ethyl diazoacetate as the carbene source. A rhodium porphyrin carbene intermediate was proposed in the reaction, which is more effective for primary than secondary or tertiary alcohols, and with the bulky TMP ligand providing the most selectivity. ... 

The impact of an ion beam on the electrode surface can result in the transfer of the kinetic energy of the ions to the surface atoms and their release into the vacuum as a wide range of species—atoms, molecules, ions, atomic aggregates (clusters), and molecular fragments. This is the effect of ion sputtering. The SIMS secondary ion mass spectrometry) method deals with the mass spectrometry of sputtered ions. The SIMS method has high analytical sensitivity and, in contrast to other methods of surface analysis, permits a study of isotopes. In materials science, the SIMS method is the third most often used method of surface analysis (after AES and XPS) it has so far been used only rarely in electrochemistry. 

Secondary antibodies are offered in three different forms whole IgG, F(ab )2 fragments, and Fab fragments. The whole IgG form of antibodies is suitable for the majority of immunodetection procedures, and is the most cost-effective. 

Subsequent work confirmed this apparently abnormal behaviour. Deuteriation at remote sites (the S- or e-position) induces small inverse secondary isotope effects in a-cleavages occurring in the ion source, but normal isotope effects in the decomposition of metastable ions in the field-free regions94,95. The time dependence of the isotope effect was also studied by field ionization kinetics, which permit the analysis of fragmentations occurring after lifetimes as short as 10 12 s-1. It was found that the inverse isotope effect favouring loss of the deuteriated radical operates at times shorter than 10 9 s95. 

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