Extended X-Ray Absorption Fine

EXAFS Extended X-ray absorption fine structure spectroscopy. A spectroscopic technique which can determine interatomic distances very precisely. 

EXAFS Extended x-ray absorption fine structure [177, 178] Variation of x-ray absorption as a function of x-ray energy beyond an absorption edge the probability is affected by backscattering of the emitted electron from adjacent atoms Number and interatomic distance of surface atoms... 

Lee P A, Citrin P H, Eisenberger P and Kincaid B M 1981 Extended x-ray absorption fine structure—its strengths and limitations as a structural tool Rev. Mod. Rhys. 53 769-806... 

Addresses the need for advanoed methods in surfaoe extended x-ray absorption fine struoture (SEXAFS) for aoourate struotural determination. 

Stdhr J, Kollin E B, Fischer D A, Flastings J B, Zaera F and Sette F 1985 Surface extended x-ray-absorption fine structure of low-Z adsorbates studied with fluorescence detection Rhys. Rev. Lett. 55 1468-71... 

Ingalls R, Crozier E D, Whitmore J E, Seary A J and Tranquada J M 1980 Extended x-ray absorption fine structure of sodium bromide and germanium at high pressure J. Appl. Phys. 51 3158... 

Figure 8.34 Experimental method for extended X-ray absorption fine structure (EXAFS)...

Figure 8.38 Curve fitting of Mo extended X-ray absorption fine structure (EXAFS) for Mo(SC6H4NH)3, taking into account (a) sulphur and (b) sulphur and nitrogen atoms as near neighbours. (Reproduced, with permission, trom Winnick, H. and Doniach, S. (Eds), Synchrotron Radiation Research, p. 436, Plenum, New York, 1980)...

Extended x-ray absorption fine stmcture measurements (EXAFS) have been performed to iavestigate the short-range stmcture of TbFe films (46). It is observed that there is an excess number of Fe—Fe and Tb—Tb pairs ia the plane of the amorphous film and an excess number of Tb—Fe pairs perpendicular to film. The iacrease of K with the substrate temperature for samples prepared by evaporation is explained by a rearrangement of local absorbed atom configurations duting the growth of the film (surface-iaduced textuting) (47). 

Surface Extended X-Ray Absorption Fine Structure and Near Edge X-Ray Absorption Fine Structure (SEXAFS/NEXAFS)... 

This chapter contains articles on six techniques that provide structural information on surfaces, interfeces, and thin films. They use X rays (X-ray diffraction, XRD, and Extended X-ray Absorption Fine-Structure, EXAFS), electrons (Low-Energy Electron Diffraction, LEED, and Reflection High-Energy Electron Diffraction, RHEED), or X rays in and electrons out (Surfece Extended X-ray Absorption Fine Structure, SEXAFS, and X-ray Photoelectron Diffraction, XPD). In their usual form, XRD and EXAFS are bulk methods, since X rays probe many microns deep, whereas the other techniques are surfece sensitive. There are, however, ways to make XRD and EXAFS much more surfece sensitive. For EXAFS this converts the technique into SEXAFS, which can have submonolayer sensitivity. 

Alternatives to XRD include transmission electron microscopy (TEM) and diffraction, Low-Energy and Reflection High-Energy Electron Diffraction (LEED and RHEED), extended X-ray Absorption Fine Structure (EXAFS), and neutron diffraction. LEED and RHEED are limited to surfaces and do not probe the bulk of thin films. The elemental sensitivity in neutron diffraction is quite different from XRD, but neutron sources are much weaker than X-ray sources. Neutrons are, however, sensitive to magnetic moments. If adequately large specimens are available, neutron diffraction is a good alternative for low-Z materials and for materials where the magnetic structure is of interest. 

The discovery of the phenomenon that is now known as extended X-ray absorption fine structure (EXAFS) was made in the 1920s, however, it wasn t until the 1970s that two developments set the foundation for the theory and practice of EXAFS measurements. The first was the demonstration of mathematical algorithms for the analysis of EXAFS data. The second was the advent of intense synchrotron radiation of X-ray wavelengths that immensely facilitated the acquisition of these data. During the past two decades, the use of EXAFS has become firmly established as a practical and powerfiil analytical capability for structure determination. ... 

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