High resolution electron energy loss spectroscopy, described

As the table shows, a host of other techniques have contributed a dozen or fewer results each. It is seen that diffraction techniques have been very prominent in the field the major diffraction methods have been LEED, PD, SEXAFS, XSW, XRD, while others have contributed less, such as NEXAFS, RHEED, low-energy position diffraction (LEPD), high-resolution electron energy loss spectroscopy (HREELS), medium-energy electron diffraction (MEED), Auger electron diffraction (AED), SEELFS, TED and atom diffraction (AD). The major non-diffraction method is IS, which is described in chapter BL23. 

High resolution analytical electron microscopy (HRAEM) is not confined to surface analysis, and applications of this as well Auger (AES) and electron energy loss (EELS) spectroscopies are described. 

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