Energy Dispersive X-Ray Analysis EDX

SEM studies of composites were carried out using a JEOL JSM-T300 scanning electron microscope. Energy dispersive X-ray (EDX) analysis was performed by energy dispersive device LINK 860-500 attached to the SEM unit. JEOL-JEM-200 transmission electron microscope was used for TEM investigations. 

Elemental analysis can also be performed on SEM samples using x-ray spectrometer attachments [55], The techniques are known as energy dispersive x-ray (EDX) analysis and wavelength dispersive x-ray (WDX) analysis and require installation of a detector in the sample chamber. 

Behr et al [3] have studied thick bulk-like AlxGai.xN layers, 0 < x < 0.15, where x was determined from SIMS and energy dispersive X-ray (EDX) analysis. For the Ai(LO) mode a linear increase with x... 

The above work prompted attempts [60] to incorporate other metals also into ZSM-5 by direct solid-state reactions. Thus, a long-distance transfer and fairly uniform distribution of indium in large ZSM-5 crystals occurs when powdered In2C>3 and ZSM-5 are loosely mixed and then subjected to reduction in hydrogen at a temperature as low as 623 K. Energy dispersive X-ray (EDX) analysis of In2C>3 distribution on ZSM-5 crystals varied between 2.8 and 3.6 wt%, with an average of 3.21 wt%. The reductive solid-state ion... 

The mechanical strength of extrudates was measured with an standardized apparatus according to ASTM D-4179 and the crush strength was obtained as the average of 20 measurements. A scanning electron microscope (SEM) ISI DS-130 coupled to a Kevex Si/Li detector and a Sun SparcStation 5 for energy dispersive X-ray (EDX) analysis was used to... 

The observation of the structure and determination of the composition of particles can be carried out by transmission electron microscopy (TEM) in connection with energy dispersive x-ray (EDX) analysis. 

The ingress of electrolyte cations into the MOF framework was confirmed by scanning electron microscopy/energy-dispersive x-ray (EDX) analysis of electrochemically treated deposits of Cu-MOF. Results obtained after application of a reductive potential step to Cu-MOF crystals in contact with acetate buffers are shown in Figure 5.3. Here, EDX spectra for (a) pristine Cu-MOF and (b) Cu-MOF after application of a constant potential of-1.0 V for 10 min are shown. EDX spectra of original Cu-MOF crystals exhibits prominent Cu peaks at 1.0, 8.0, and 8.4 keV accompanied by a Si signal at 1.9 keV. After the electrolysis step, an additional Na peak at 1.1 keV appears. 

Scanning electron microscopy (SEM) combined with energy dispersive X-ray (EDX) analysis could be used to physico-chemical characterization of SILMs [26]. This technique allows the characterization of the membrane surface morphology and the examination of the global chemical composition of the membranes and the distribution of the ILs within pores. Figure 11.2 shows examples of SEM micrographs of a plain nylon membrane and supported liquid membranes based on [bmim ][PF ] prepared by using the pressure method [26]. 

SEM studies were carried out on broken rock surfaces and polished sections coated with carbon and gold/palladium using a Phillips XL20 electron microscope connected to a back-scattered electron (BSE) detector. Energy-dispersive X-ray (EDX) analysis was employed to study the composition of representative authigenic minerals. 

Figure 9.1 shows an example of nanoparticles formed from H2PtClg and NaAuCl4 (below 10 mM). The supporting electrolyte was HC104 (1 M). Energy dispersive X-ray (EDX) analysis revealed that the particles formed are an alloy... 

SEMs are now often equipped with an energy-dispersive X-ray (EDX) analysis system for the elemental analysis of certain specimens. For example, the standard forensic laboratory test for identifying gunshot residue is based on the use of an electron microscope equipped with an EDX analyser. 

Our own data obtained from energy dispersive X-ray (EDX) analysis on epitaxial siloxene films confirm this general result. Figure 1 shows the typical EDX spectrum of a 1 pm-thick siloxene film on Si(l 11), obtained by exposure to concentrated HCl at 0 °C for one hour and washed in acetone. Whereas Ca is obviously completely removed from the sample, the film still contains some Cl not entirely washed out. From the spectrum, the Si 0 ratio is determined as 2.1 1. Thus, the formation of (Si2HOH)n is confirmed to be favored compared to that of related compounds with a lower or higher oxygen content. Indeed, siloxene is relatively stable in ambient atmosphere, in contrast to polysilyne (SiH) , which is reported to combust spontaneously in air [10]. Since in the ideal siloxene structure the single Si layers are exclusively terminated by H on one side and by OH on the... 

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