Electrons, high-energy transmission

Another study focusing on the comparison between theoretical and experimental densities is that of Tsirelson el al. on MgO.133 Here precise X-ray and high-energy transmission electron diffraction methods were used in the exploration of p and the electrostatic potential. The structure amplitudes were determined and their accuracy estimated using ab initio Hartree-Fock structure amplitudes. The model of electron density was adjusted to X-ray experimental structure amplitudes and those calculated by the Hartree-Fock model. The electrostatic potential, deformation density and V2p were calculated with this model. The CPs in both experimental and theoretical model electron densities were found and compared with those of procrystals from spherical atoms and ions. A disagreement concerning the type of CP at ( , 0) in the area of low,... 

Alternatives to XRD include transmission electron microscopy (TEM) and diffraction, Low-Energy and Reflection High-Energy Electron Diffraction (LEED and RHEED), extended X-ray Absorption Fine Structure (EXAFS), and neutron diffraction. LEED and RHEED are limited to surfaces and do not probe the bulk of thin films. The elemental sensitivity in neutron diffraction is quite different from XRD, but neutron sources are much weaker than X-ray sources. Neutrons are, however, sensitive to magnetic moments. If adequately large specimens are available, neutron diffraction is a good alternative for low-Z materials and for materials where the magnetic structure is of interest. 

In this section we will discuss perturbation methods suitable for high-energy electron diffraction. For simplicity, in this section we will be concerned with only periodic structures and a transmission diffraction geometry. In the context of electron diffraction theory, the perturbation method has been extensively used and developed. Applications have been made to take into account the effects of weak beams [44, 45] inelastic scattering [46] higher-order Laue zone diffraction [47] crystal structure determination [48] and crystal structure factors refinement [38, 49]. A formal mathematical expression for the first order partial derivatives of the scattering matrix has been derived by Speer et al. [50], and a formal second order perturbation theory has been developed by Peng [22,34],... 

THEED Transmission High Energy Electron Diffraction... 

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY IMAGE ANALYSIS OF DISORDERED CARBONS USED FOR ELECTROCHEMICAL STORAGE OF ENERGY... 

Chemical fixation for transmission electron microscopy prepares cells for the preservation of damage due to subsequent washing with aqueous solvents, dehydration with organic solvents such as ethanol or acetone, embedding in plastic resins, polymerization of the resins by heat, exothermic catalysts, or ultraviolet radiation, and imaging with high-energy electron beams in an electron microscope. 

We now briefly review some theoretical aspects of transmission ED using high-energy electrons based on an electron wave mechanical formulation of the dynamical theory of contrast. 

For single crystal substrates which are not in the form of thin films, the techniques of transmission microscopy and nanodiffraction can not be used. For such cases, the techniques of reflection electron microscopy (REM) or its scanning variant (SREM) and reflection high energy electron diffraction (RHEED), in the selected area or convergent beam modes, may be applied (18). 

Key words Heterogeneous catalysts High-resolution transmission electron microscopy Electron diffraction Electron energy-loss spectroscopy... 

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