Electron Specimen Interaction and Emission

When the incident electrons strike a sample, they will scatter primarily in two different modes elastic or inelastic. In elastic scattering the electrons 

Elements generally detectible by ICP-AES are enclosed with a heavy border.  

The intensity of secondary electrons is very dependent on topography. Due to their low energy, only the secondary electrons that are very near the surface ( 10 nm) can exit the specimen and be detected. A secondary electron detector can be either positively biased or negatively biased. A positively biased secondary electron image shows more topographical features, while a negatively biased secondary electron image has better contrast. 

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