Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Electron emission trapping time

However, part of the electrons are trapped in the electron trap center, from where they escape thermally after some time. Only then they recombine with a trapped hole. The corresponding emission occurs with considerable delay tuid is called afterglow. [Pg.65]

Using a stable dopant as the emissive dye has been shown to greatly enhance the lifetime of small molecule LEDs. Rubrene doped into the Alq, electron transport layer ] 184] or into the TPD hole transport layer 1185] can extend the lifetime by an order of magnitude. Similarly, dimclhylquinacridone in Alq has a beneficial effect ]45 ]. The likely mechanism responsible for this phenomenon is that the dopant acts as a trap for the excilon and/or the charge. Thus, molecules of the host maLrix are in their excited (cationic, anionic or cxcitonic) states for a smaller fraction of the time, and therefore have lower probability to undergo chemistry. [Pg.237]

The net carrier concentration, shown in Fig. 7.8, was obtained at a frequency of 100 kHz. DLTS spectra were recorded using reverse- and forward-bias modes in the temperature range of 80-350 K. In the re verse-bias mode, the devices were reverse biased from -1.2V to -0.2V, with a pulse width of 1 ms. Two hole (majority-carrier) trap levels were found in all the devices. These levels were designated as Hi at I iv+0.26 and H2, for which an activation energy could not be resolved. Upon minority-carrier injection (forward-bias mode), DLTS showed two additional electron (minority-carrier) traps, which are labeled Ei (Ec-0.1eV) and E2 (Ec-0.83eV) in Table 7.1. The spectra were measured at an emission time of 465.2 s and the width of the... [Pg.216]

Time-resolved measurements of photogenerated (very intense illumination, up to 0.56 GW/cm ) electron/hole recombination on CD (selenosulphate/NTA bath) CdSe of different crystal sizes has shown that the trapping of electrons, probably in surface states, occurs in ca. 0.5 ps, and a combination of (intensity-dependent) Auger recombination and shallow-trapped recombination occurs in a time frame of ca. 50 ps. A much slower (not measured) decay due to deeply trapped charges also occurred [102]. A different time-resolved photoluminescence study on similar films attributed emission to recombination from localized states [103]. In particular, the large difference in luminescence efficiency and lifetime between samples annealed in air and in vacuum evidenced the surface nature of these states. [Pg.179]


See other pages where Electron emission trapping time is mentioned: [Pg.65]    [Pg.192]    [Pg.193]    [Pg.159]    [Pg.397]    [Pg.238]    [Pg.311]    [Pg.25]    [Pg.185]    [Pg.165]    [Pg.200]    [Pg.179]    [Pg.451]    [Pg.136]    [Pg.225]    [Pg.226]    [Pg.1371]    [Pg.25]    [Pg.2473]    [Pg.395]    [Pg.380]    [Pg.100]    [Pg.417]    [Pg.549]    [Pg.35]    [Pg.93]    [Pg.334]    [Pg.15]    [Pg.167]    [Pg.434]    [Pg.231]    [Pg.112]    [Pg.8]    [Pg.13]    [Pg.116]    [Pg.193]    [Pg.194]    [Pg.199]    [Pg.200]    [Pg.200]    [Pg.201]    [Pg.204]    [Pg.417]    [Pg.561]    [Pg.180]    [Pg.157]   
See also in sourсe #XX -- [ Pg.223 , Pg.224 ]




SEARCH



Electron emission

Electronic trap

Trapping time

© 2024 chempedia.info