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ELECTRON DISPERSIVE X-RAY

The shock-modified composite nickel-aluminide particles showed behavior in the DTA experiment qualitatively different from that of the mixed-powder system. The composite particles showed essentially the same behavior as the starting mixture. As shown in Fig. 8.5 no preinitiation event was observed, and temperatures for endothermic and exothermic events corresponded with the unshocked powder. The observations of a preinitiation event in the shock-modified mixed powders, the lack of such an event in the composite powders, and EDX (electron dispersive x-ray analysis) observations of substantial mixing of shock-modified powders as shown in Fig. 8.6 clearly show the first-order influence of mixing in shock-induced solid state chemistry. [Pg.188]

Fig. 16.7. Triberg yeasts, (a) Colony of round and oval-shaped yeast cells enriched in a small pocket in a granite fracture in the vicinity of the haematite-covered mycelia. The yeast cells are preserved in a yellow to orange colour. Electron dispersive X-ray analyses of the cellular wall found an enrichment of carbon. Many yeast cells are completely covered with small haematite crystals and therefore exhibit an opaque optical character, (b) In a few tight fractures the yeast cells are part of microbial biofilms. In such fractures mycelia networks are not present. Fig. 16.7. Triberg yeasts, (a) Colony of round and oval-shaped yeast cells enriched in a small pocket in a granite fracture in the vicinity of the haematite-covered mycelia. The yeast cells are preserved in a yellow to orange colour. Electron dispersive X-ray analyses of the cellular wall found an enrichment of carbon. Many yeast cells are completely covered with small haematite crystals and therefore exhibit an opaque optical character, (b) In a few tight fractures the yeast cells are part of microbial biofilms. In such fractures mycelia networks are not present.
Wan] SEM-Electron Dispersive X-ray analysis Partial isothermal sections at 800°C, (Cu)/a phase boundaries at 900°C, (Cu)/y phase boundaries at 1000°C, (Cu)/y phase boundaries at 1200°C, (L)/y phase boundaries... [Pg.106]

Kiml, 2000Kim2] Pyrometry, optical microscopy, SEM -electron dispersive X-ray analysis 40 to 80 mass% Cu, 10 to 50 mass% Co, 10 to 50 mass% Fe, liquidus and solidus temperatures, melt separation temperatures... [Pg.602]

Wan] SEM - electron dispersive X-ray analysis of quenched samples 800 to 1000°C, a/(Cu) and y/iCu) phase boxmdaries... [Pg.602]

Nowadays, the use of the reflection electron microscope (REM) or, recently, the tunnel electron microscope, as well as secondary ion mass spectrometry (SIMS), AES, electron-dispersive X-ray spectrometry, impedance spectroscopy, and so on, are yielding substantial increases in the knowledge of corrosion reactions in coatings and at their interface with metal or other substrates. As far as zinc or zinc-coated surfaces are concerned, problems of interfacial and intercoat adhesion, differential diffusion phenomena and electrolytic cell behavior on the substrate, and interreactions of zinc with conversion coatings (chromates, phosphates, silanes, silanols, etc.) have been analyzed, leading toward spectacular improvements in, for example, paint adhesion, absorption of conversion coatings and, in general, the protective action inside films as well as on their substrates. [Pg.96]

AlAs/GaAs. Sample preparation and laser melting techniques are found in reference [62], Images of Al, Ga, Si, and O were sequentially recorded with a resistive anode encoder as the sample was depth profiled with Cs" and positive secondary ions in a Cameca IMS 5f in the microscope mode of operation. Two-dimensional cross sections of the Al, Ga, Si, and O images from a 60 pm rectangular slice centered around the 4 pm laser stripe were then computer generated and are shown in Fig. 4.30a. Depth profiles of Al, Ga, and O from selected 4 pm areas were also generated in the non laser-striped area in Fig. 4.30b and in the laser-striped area in Fig. 4.30c. Samples similar to the one in Fig. 4.30 have been analyzed with TEM, SEM, and electron dispersive X-ray spectroscopy (EDS) in addition to SIMS for full characterization [62]. [Pg.180]


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ELECTRON DISPERSIVE X-RAY ANALYSIS

Electron disperse

Electron dispersion

Electron dispersity

Electron dispersive X-ray spectroscopy

Energy Dispersive X-Ray Microanalysis in the Electron Microscope

Scanning electron microscopy and energy dispersive analysis using X-rays

Scanning electron microscopy energy dispersive X-ray spectroscopy

Scanning electron microscopy/energy dispersive X-ray analysis (SEM

X dispersive

X electron

X-ray dispersion

X-ray electron

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