Electron attachment rate constant

In nonpolar liquids, bimolecular electron attachment rate constants, k , are much larger than those for conventional reactions of ions or radicals. This is, in part, related to the high mobility of electrons in these liquids but various other factors, like Vq, the kinetic energy of the electron, and dipole moment of the solute, are important as well. These and other factors are examined below the dependence of on the energy gap, AGr, in representative liquids is also shown and discussed. 

The use of the weakly bound electron in a Rydberg atom to measure low energy electron attachment rate constants has proven to be one of the more useful applications of Rydberg atoms. Measurements have been refined to the point of measuring the lifetimes of negative ions formed by attachment,96 and it is likely that further developments will follow. 

The value of the radius, R, used is 1 nm, p is the density in g/cm. The value of the rate constant at high pressure is below the theoretical diffusion rate, however it is actually at or above the maximum value expected for electron attachment rates. Warman predicted that electron attachment rate constants are not expected to exceed 3 X 10 That rate constant corresponds, in the units used... 

The electron attachment rate constant for SFg in nitrogen at ambient temperature and pressure showed a smooth decline with increasing E/N over the range of 0.39-0.78 Td [56]. As shown in Figure 13.7, the results obtained by IMS agree closely with those obtained by the well-established high-pressure swarm technique [57]. A further series of experiments with E/N from 0.05 to 0.9 Td confirmed this excellent agreement between the two methods [55]. 

Fig. 5. Electron attachment rate constants for NF3 as a function of the mean electron energy, from [13].

FIGURE 3 Total electron-attachment rate constant as a function of the mean electron energy s) for the perfluoroalkanes CA/F2A/+2 (N= -6) and their dc uniform field breakdown voltages relative to SFe. [From Christophorou, L. G., et al. (1984), IEEE Trans. Elect. Insul. El-19, 550-566.]... 

Fig. 20. Electron attachment rate constant versus the mean...

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