Electric-field-induced metal migration

Although Sah etal. (1983) and Gale etal. (1983) have demonstrated that H can be introduced into Si by electron injection into the oxide layer of metal-oxide-silicon devices, there has been no report of hydrogen penetration with an applied bias of opposite polarity. This may suggest electric-field-induced proton migration through the oxide. 

One of the more recent technologies in pollution treatment and remediation is based on the electrokinetic decontamination of soils [126-128], in which a dc potential (a few volts per centimeter) is applied across two inert electrodes embedded in a soil mass. This applied potential causes decomposition of the soil water to occur at the two electrodes. The migration of contaminants in the electric field, water transport, and reactions at the electrodes, as well as reactions caused by the induced pH gradient, can effectively clean soils. Acar et al. [127] reviewed electrokinetic remediation for the removal of metals and other inorganic contaminants from soil as well as its use in the extraction of organics from contaminated soils. 

Repetitive passage of a molten zone along a bar of the impure actinide metal (zone melting), particularly when followed by the induced migration of impurities in the solid by an impressed electric field (electrotransport), can be used to reduce the impurity level in Pu from 200 ppm to 20 ppm. 

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