Dielectric analyzer

Anonymous. DEA 2970 Dielectric Analyzer. Brochure. New Castle, DE TA Instruments 1995. 

KDC, 1993. Us MDA-1000 Microwave Dielectric Analyze for Process Monitoring and Control. KDC Technology Corp., 2011 Research Dr., Livermore, CA. 

Further detailed TEM/EELS analysis at the center of the gate dielectric was done such that the TEM probe was positioned at the center of the gate dielectric, analyzing the EELS signals from the non-breakdown and then across breakdown location as shown in Fig. 2b. In this case, the TEM probe is always moving parallel to the polysilicion/oxide and oxide/Si substrate interfaces. Any change in... 

Figure 44. Dielectric loss spectra of PI. The data at 216.0 K (OX 211-15 K ( ), 208.15 K(OX and 204.15 K (V) were obtained using the IMass Time-Domain Dielectric Analyzer. All the other data, which start at 10 Hz and continue up to 100 kHz, were taken with the CGA-83 Capacitance Bridge. There is good agreement of the CGA-83 data at 216.7 K ( ), 212.7 K (I), 208.7 ( ), and...

TMA, thermomechanical analysis DMA, dynamic mechanical analysis DSC, differential scanning calorimetry DBA, DuPont dielectric analyzer. 

The higher optical transparency of these polymers is attributed to the presence of the pendant 4-trilluoro-methylphenyl substituents in the polymer backbone. The dielectric constant values were measured by the parallel plate capacitor method using a dielectric analyzer. These PAs showed lower dielectric constants, in the range of 3.40-3.51 (1 MHz), than commercial Nylatron (approximately 3.7 at 1 MHz). The low dielectric constant values of these new PAs are mainly due to the presence of bulky 4-trilluorometh-ylphenyl pendant groups. 

The company s dielectric analyzer (DEA) measures capacitive and conductive properties over different frequencies, temperatures, and times to determine the permittivity e, loss factor e", dielectric loss tangent tan 8, and ionic conductivity. The DEA measures data at eight decades from 0.003 to 300,000 Hz [3]. Decades and octaves quantify frequency changes. 

A dielectric analyzer (DEA) measures the capacitive and conductive properties of materials as a function of temperature, time, and frequency under a controlled atmosphere. It provides high-sensitivity studies of the chemistry, rheology, and molecular mobility of materials. It can offer considerably improved sensitivity to low-energy transitions over what is available from DSC or TMA. A key feature of DEA is its flexibility for analysis of liquids, paste, and powder samples. 

For each pol5mier in this series, dielectric permittivity of polyimide films was measured by using Alpha High Resolution Dielectric Analyzer from Novocontrol-Germany, in the domain of frequencies from KT to 10 Hz, and it was approximated at the frequency equal to zero to obtain the value of dielectric constant (e ). 

E2038, Standard Test Method for Temperature Calibration of Dielectric Analyzers... 

Chemical ElectroPhysics, Application Note Preceptor In-line Dielectric Analyzer, Hockessin, DE (n.d.). 

The spin coated samples were sputter coated with gold on top of the polymer to produce an electrically conductive surface. Two samples of each thickness were placed into a TA Instruments DEA 2970 Dielectric Analyzer and equilibrated at 35°C. The temperature was then ramped from 35°C to 150°C or 180°C at 2°C/min. The frequency sweep included 50,000, 60,000, 70,000, 80,000, 85,000, 90,000, 95,000, 100,000 Hz. A schematic of the instrument appears in Figure 3.1-1. 

Electrically insulating materials can be analyzed in HF-plasma SNMS by applying a square-wave HF in the 100 kHz range to the sample (Fig. 3.34). Dielectric charge transfer at the start of a period shifts the surface potential to the amplitude Uhfm applied. Ar" ions are attracted from the plasma and sputter the surface until the end of At . The potential increase AU = 1-100 V caused by their charge is then converted to a positive absolute AU which is reduced to less than 1 V within <0.1 ps by the... 

The number of measurable layers of a stack is limited only by the optical contrast between the different layers. In practice stacks of ten layers and more can be analyzed by ellipsometry. Further advantages of ellipsometry compared with other metrological methods are the non-invasive and non-destructive character of the optical method, the low energy entry into the sample, the direct measurement of the dielectric function of materials, and the possibility of making the measurement in any kind of optical transparent environment. 

Capacitive Sensors. This device usually consists of a capacitor which is formed either from two concentric cylinders or from a pair of parallel plates. The solid sample to be analyzed for moisture content is passed between these plates. Since w has a large dielectric constant, the w content of the sample causes a significant change in the dielectric constant of the solid, which is measured using bridge or frequency techniques. 

Since we are interested in this chapter in analyzing the T- and P-dependences of polymer viscoelasticity, our emphasis is on dielectric relaxation results. We focus on the means to extrapolate data measured at low strain rates and ambient pressures to higher rates and pressures. The usual practice is to invoke the time-temperature superposition principle with a similar approach for extrapolation to elevated pressures [22]. The limitations of conventional t-T superpositioning will be discussed. A newly developed thermodynamic scaling procedure, based on consideration of the intermolecular repulsive potential, is presented. Applications and limitations of this scaling procedure are described. 

Azo-bridged ferrocene oligomers also show a marked dependence on the redox potentials and IT-band characteristics of the solvent, as is usual for class II mixed valence complexes 21,22). As for the conjugated ferrocene dimers, 2 and 241 the effects of solvents on the electron-exchange rates were analyzed on the basis of the Marcus-Hush theory, in which the t/max of the IT band depends on (l/Dop — 1 /Ds), where Dop and Ds are the solvent s optical and static dielectric constants, respectively (155-157). However, a detailed analysis of the solvent effect on z/max of the IT band of the azo-bridged ferrocene oligomers, 252,64+, and 642+, indicates that the i/max shift is dependent not only on the parameters in the Marcus-Hush theory but also on the nature of the solvent as donor or acceptor (92). 

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