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Defect environment

The critical factors governing defect-related failures are the severity of the defect and the environmental conditions with which the defect may interact to produce failure. A defect, if sufficiently severe, may cause failure in and of itself, without contributions from environmental conditions. Defect-environment interactions are more common, however. Unquestionably, equipment can operate satisfactorily with components containing significant defects simply because there are no environmental conditions with which the defect may interact to produce failure. [Pg.317]

Since the potentials were constructed by fitting equilibrium properties of the Llo lattice it is very important to test that spurious unphysical structures may not be stabilized in a defective environment. While this can never be done fully, two types of tests can be carried out that provide a reasonable assurance. [Pg.358]

We proceed now to describe some of the most common approximations to the defect environment and the many-body Schrodinger equation and some simple models relating to defects in semiconductors that have been deduced from them. [Pg.529]

When a defect is introduced into a crystalline environment, crystal translational symmetry can no longer be invoked to transform the problem into tractable form as is done in band-structure calculations. Most of the computational treatments of defects in semiconductors rely on approximations to the defect environment that fall into one of three categories cluster, supercell (or cyclic cluster), and Green s function. [Pg.529]

Kurzel RB, Cetrulo CL. 1981. The effect of environmental pollutants on human reproduction, including birth defects. Environ Sci Technol 15(6) 626-640. [Pg.361]

In toto, the neighbouring defects act in a repulsive way on a jump of the carrier under consideration from A to B. As long as the defect environment has not adjusted to the new situation, the potential minimum at B is higher than that at A, causing... [Pg.319]

Here, it is primarily the relaxation of the defect environment that is meant. It is assumed that the structural relaxation of the perfect lattice takes place in the time or frequency range of the lattice vibration (and is, thus, of the same order of magnitude as the attempt frequency, see Chapter 3). [Pg.320]

The recent evidence of workmanship-related defects to major structures in extreme environments leaves a nagging doubt about weather the real issues behind the problems have really been understood, acknowledged and dealt with at all levels. [Pg.996]

From polarization curves the protectiveness of a passive film in a certain environment can be estimated from the passive current density in figure C2.8.4 which reflects the layer s resistance to ion transport tlirough the film, and chemical dissolution of the film. It is clear that a variety of factors can influence ion transport tlirough the film, such as the film s chemical composition, stmcture, number of grain boundaries and the extent of flaws and pores. The protectiveness and stability of passive films has, for instance, been based on percolation arguments [67, 681, stmctural arguments [69], ion/defect mobility [56, 57] and charge distribution [70, 71]. [Pg.2725]

Intrinsic defects (or native or simply defects ) are imperfections in tire crystal itself, such as a vacancy (a missing host atom), a self-interstitial (an extra host atom in an otherwise perfect crystalline environment), an anti-site defect (in an AB compound, tliis means an atom of type A at a B site or vice versa) or any combination of such defects. Extrinsic defects (or impurities) are atoms different from host atoms, trapped in tire crystal. Some impurities are intentionally introduced because tliey provide charge carriers, reduce tlieir lifetime, prevent tire propagation of dislocations or are otlierwise needed or useful, but most impurities and defects are not desired and must be eliminated or at least controlled. [Pg.2884]

Several nontechnical factors can significantly affect the results of a nondestmctive inspection. Many of these are classified as human factors (1,2,17). Operator experience affects the probabiUty of detection of most flaws. Typically, an inexperienced operator has more false rejects, known as Type II errors, than an experienced operator. A poor operator has few false rejects but is more likely to miss a defect in the inspection, known as a Type I error. Operator fatigue, boredom, or an unfavorable environment such as lighting, cold, or rain may further affect performance. Thus it usually is a good investment for the inspection company to assure that the operator environment is most amenable to inspection, that the equipment is suitable for the task, and that the operator is alert and well rested. [Pg.123]

In the area of consumer products, amperometric glucose sensors hold high potential. Industrially, process monitors for the manufacture of consumer chemicals are under development. However, replacement of defective reference electrodes, which in a laboratory environment may be trivial, may be prohibitively difficult m vivo or in an industrial process environment. [Pg.58]

Such defects result from abnormal manufacturing operations such as insufficient lubrication between the metal and the mandrel during the tube-forming process. The lubricant may have been contaminated. Measurement indicated that some of these defects penetrated 8% of the tube wall thickness. Defects of this type can act as corrosion-initiation sites in a sufficiently aggressive environment. [Pg.323]


See other pages where Defect environment is mentioned: [Pg.529]    [Pg.514]    [Pg.122]    [Pg.333]    [Pg.87]    [Pg.741]    [Pg.529]    [Pg.514]    [Pg.122]    [Pg.333]    [Pg.87]    [Pg.741]    [Pg.67]    [Pg.167]    [Pg.208]    [Pg.872]    [Pg.915]    [Pg.2484]    [Pg.2495]    [Pg.2884]    [Pg.2901]    [Pg.2927]    [Pg.259]    [Pg.325]    [Pg.249]    [Pg.294]    [Pg.44]    [Pg.195]    [Pg.123]    [Pg.146]    [Pg.13]    [Pg.308]    [Pg.366]    [Pg.283]    [Pg.303]    [Pg.125]    [Pg.317]    [Pg.339]    [Pg.157]    [Pg.210]   
See also in sourсe #XX -- [ Pg.333 ]




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