Cross-Sectional Scanning

Fig. 18. Cross-sectional scanning electron micrograph of a three-layered alumina membrane/support (pore sizes 0.2, 0.8, and 12 p.m, respectively).

Fig. 2. Cross-section scanning electron micrographs of a-Si H deposited on etched crystalline silicon substrates under (a) CVD conditions, 2W, 300°C, 100% SiH4 and (b) PVD conditions, 25W, 300°C, 5% SiH4 in argon (Tsai et al., 1986).

FIGU RE 6.14 Cross-sectional scanning electron micrograph of ametal-supported SOFC, with anode and electrolyte produced by SPS and cathode produced by screen printing. Electrolyte is approximately 30 pm thick [46]. Reprinted from [46] with permission from Elsevier. 

Figure 3. (a) Plan view image of a SOI waveguide microspectrometer with 0.08 nm channel spacing and 20 nm free spectral range, (b) Plan view and a cross-section scanning electron microscope view of the waveguide apertures at the combiner output. 

Cross-sectional scanning tunneling microscopy (XSTM) measurements were carried out for a cleaved (110) surface of GaAs doped with Mn. The samples were cleaved in an ultrahigh vacuum (UHV) chamber in order to expose the atomically flat (110) surface. The measurements have been done in the UHV chamber at room temperature. 

The acceleration is a direct measure to the dynamic factors. However, there are few reports, if not to say none, about that for meso-scale structures. In a recent attempt, Meng et al. (2009) made use of the multiple sensors of an X-ray computerized tomography (CT) to measure the cluster accelerations. Instead of the conventional use of CT for cross-sectionally scanning the solids distribution, they erected the X-ray fan-beam and the sensors to follow the vertical movement of clusters... 

Damage mode Visual 1-50 x fracture surface Metallography 50-1000 x (cross-section) Scanning electron microscopy, 20-10000 x (fracture surface)... 

FIGURE 20.17 (A) X-ray diffraction spectra and (B) cross-sectional scanning electron micrograph image of 160 nm Ta(Al)N(C) film on a patterned silicon wafer. (From AUen, R, Juppo, M., Ritala, M., Sajavaara, T., Keinonen, J., and Leskela, M., J. Electrochem. Soc., 148, G566, 2001.)... 

InGaP/GaAs HETEROINTERFACES STUDIED BY CROSS-SECTIONAL SCANNING TUNNELING MICROSCOPY AND THEIR IMPACT ON THE DEVICE CHARACTERISTICS... 

InGaP/GaAs heterointerfaces studied by cross-sectional scanning tunneling microscopy and their impact on the device characteristics (invited).18... 

Figure 5.38 Cross-section scanning electron micrograph showing the concurrent deformation of the scale and alloy during thermal cycling of an Fe-Cr-Al-Ti alloy from 1100 °C to room temperature.

Figure 5.40 Cross-section scanning electron micrograph showing the alumina scale formed on a Y-doped Fe-Cr-Al alloy after cychc oxidation at 1100°C for 525 h.

Fig. 2.3 Top Cross-sectional scanning electron micrographs of the micromorphology of Pt ionic-polymer metal composites after treatment of the initial compositing process (ICP) (a) and the surface electroding process (SEP) (b). The bottom images show the cross-sectional view of the digital scanning microscope of the Pt IPMCs, where the treatment of ICP is again shown on the left and SEP on the right. Reprinted from [Park et al. (2008)] with permission from Cambridge University Press.

Figure 21.2 (a) Cross-sectional scanning electron micrograph... 

Figure 22.3 Cross-sectional scanning electron micrographs of PLA-CaC03 composites (CCPC) upon exposure to SBF (a and b) 20% filler (c and d) 30% filler (a,c) 1 days (b,d) 3 days of immersion. (Reproduced with permission from Elsevier, Ref. [19].)...

Figure 1.12 Cross-sectional scanning electron microscopy images of EPD-fabricated composites or multilayered coatings (a) Laminate coatings of chitosan (Ch) and HA (H) with different layers on a graphite substrate (S) (b) 10 alternating layers of AI2O3 and Zr02 (c) polyacrylic acid films containing halloysite nanotubes (white arrows) on the platinized sihcon wafer substrate (d) sodium hyaluronate and bovine serum albumin composite films (H + B) on a graphite substrate (S).

Fig. 11. Cross-sectional scanning electron micrograph of an asymmetric Loeb-Sourirajan ultrafiltration membrane. The large macrovoids under the membrane skin (top surface) are common in this type of ultrafiltration membrane.

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