Configuration development potential

Pending the development of materials resistant to lead corrosion at higher temperature, surface treatment, and small quantities of additional elements in the stmctoral matrix and oxygen control are necessary to protect materials immersed in lead from corrosion and also to protect against the formation of solids in the lead coolant from oxidation processes. In the design configuration developed to date, relatively low coolant outlet temperatures serve to reduce the potential impact of this issue. 

In his early survey of computer experiments in materials science , Beeler (1970), in the book chapter already cited, divides such experiments into four categories. One is the Monte Carlo approach. The second is the dynamic approach (today usually named molecular dynamics), in which a finite system of N particles (usually atoms) is treated by setting up 3A equations of motion which are coupled through an assumed two-body potential, and the set of 3A differential equations is then solved numerically on a computer to give the space trajectories and velocities of all particles as function of successive time steps. The third is what Beeler called the variational approach, used to establish equilibrium configurations of atoms in (for instance) a crystal dislocation and also to establish what happens to the atoms when the defect moves each atom is moved in turn, one at a time, in a self-consistent iterative process, until the total energy of the system is minimised. The fourth category of computer experiment is what Beeler called a pattern development... 

Alternative microcrystallizer configurations are being developed that seek to avoid the mixing problems asociated with conventional agitated vessels and offer the potential of consistent precipitation of high quality crystal products. 

Circuit elements may be connected in either a series or parallel configuration. In the series configuration, the same current flows through each and every element, and the circuit potential drop (or emf that is developed by the voltage source) is the algebraic sum of the potential drops of each individual element. For sources in series, the total emf developed is the algebraic sum of the emfs developed by each individual source. 

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