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Charged particles, detection

Fig. 6. Cross sectional view of the annihilation detector showing the inner two layers of silicon strip detectors for charged particle detection and the outer cylinder of Csl crystals for 511 keV 7 detection... Fig. 6. Cross sectional view of the annihilation detector showing the inner two layers of silicon strip detectors for charged particle detection and the outer cylinder of Csl crystals for 511 keV 7 detection...
Los and coworkers at the FOM institute also used a sputtering source to study ionization cross sections of alkali metal atom collisions with O2 at relative velocities below 13 km s . These authors used magnetic fields in the charged particle detection part of their experiment, allowing them to differentiate between negative ions and e . The K + O2 measurements of Moutinho et al. are shown in Fig. 18. They are compared with the K(4 P -> 4 5) resonance line excitation cross sections of Lacmann and Herschbach after scaling them to the estimated cross section of Kempter et A dotted line indicates the measurements of Kempter et al. in-... [Pg.332]

Many types of detectors, such as Geiger-Miiller counters, proportional counters and scintillation detectors, are used for charged particle detection. The selection is made on the basis of resolution and range of particle in the gas or scintillator. In some cases, the particles are not completely stopped within the detector for an energy measurement, but deposit only a portion of their energy. This is related to the relative ionization of the particle and can be used to identify different kinds of particles. [Pg.137]

Figure 5.3 Charged particle detection methods singlephoton resonancesinphoton-particleinteraction processes... Figure 5.3 Charged particle detection methods singlephoton resonancesinphoton-particleinteraction processes...
Figure 5.4 Charged particle detection methods multiphoton resonances in photon-particle interaction processes, here exemplified for a (2 -I- 1)-REMPI process... Figure 5.4 Charged particle detection methods multiphoton resonances in photon-particle interaction processes, here exemplified for a (2 -I- 1)-REMPI process...
Because the electrically charged droplets retain their charge but get smaller, their electric field increases. At some point, mutual repulsion between like charges causes charged particles (ions) to leave the surface of the droplet (ion evaporation). These ions can be detected by the mass spectrometer. [Pg.390]

Response to Electric and Acoustic Fields. If the stabilization of a suspension is primarily due to electrostatic repulsion, measurement of the zeta potential, can detect whether there is adequate electrostatic repulsion to overcome polarizabiUty attraction. A common guideline is that the dispersion should be stable if > 30 mV. In electrophoresis the appHed electric field is held constant and particle velocity is monitored using a microscope and video camera. In the electrosonic ampHtude technique the electric field is pulsed, and the sudden motion of the charged particles relative to their counterion atmospheres generates an acoustic pulse which can be related to the charge on the particles and the concentration of ions in solution (18). [Pg.549]

A beam of charged particles (an ion beam) with an energy from a few hundred keV to several MeV is produced in an accelerator and bombards a sample. Nuclear reactions with low-Z nuclei in the sample are induced by this ion beam. Products of these reactions (typically p, d, t, He, a particles, and y rays) are detected, producing a spectrum of particle yield versus energy. Many (p, a) reactions have energies that are too low for efficient detection. In these cases, the associated y rays are detected instead. Important examples are ... [Pg.681]

With charged-particle microprobes, the samples must be stained and thinned to improve both contrast and signal-to-noise ratio coated with a thin conducting layer to reduce charging effects and improve spatial resolution and be in vacuum to maintain the charged-particle beams. Finally, information on the chemical state of the detected elements is difficult to obtain using techniques based on charged particles. [Pg.640]

In contrast to PIXE and RBS, where forces are respectively electromagnetic and electrostatic, this kind of microanalysis uses low range nuclear forces. The analysis is based on the detection of the y-rays emitted from nuclei that are in an excited state following a charged particle induced nuclear reaction. [Pg.106]


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See also in sourсe #XX -- [ Pg.399 ]




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Detection charge

Particle charge

Particle charging

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