Characterization of Dendrimer Structures by Spectroscopic Techniques

Dendrimers have precise compositional and constitutional aspects, but they can exhibit many possible conformations. Thus, they lack long-range order in the condensed phase, which makes it inappropriate to characterize the molecular-level structure of dendrimers by X-ray diffraction analysis. However, there have been many studies performed using indirect spectroscopic methods to characterize dendrimer structures, such as studies using photophysical and photochemical probes by UV-Vis and fluorescence spectroscopy, as well as studies using spin probes by EPR spectroscopy. 

Dendrimers and Other Dendritic Polymers. Edited by Jean M. J. Frechet and Donald A. Tomalia 2001 John Wiley Sons Ltd 

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N.J. Turro, W. Chen, and M.F. Ottaviani. Characterization of dendrimer structures by spectroscopic techniques, in Dendrimers and Other Dendritic Polymers. J.M.J. Frechet and D.A. Tomalia, Eds. John Wiley Sons West Sussex, pp. 309-330, 2001. 

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