Characterization, film density

Alternatively, one can determine the dependence of the local film density upon the distance from the surface z. Non-wetting films are characterized by a relative absence of atoms in the first layer on the surface compared to the usual situation where a sharp maximum in the density occurs at the monolayer separation distance. This point is illustrated in Figure 6. 

Figure 3. X-ray reflectivity profiles as a function of kz at the temperatures indicated. The reflectivity profiles have been offset vertically for clarity. The oscillations in the data, the Kiessig fringes, characterize the sample thickness independent of the film density. The line through the data were calculated by a simple three layer model as described in the text.

The value for the heat of fusion of PPS, extrapolated to a hypothetical 100% crystalline state, is not agreed upon in the literature. Reported values range from approximately 80 J/g (19 cal/g) (36,96,101) to 146 J/g (35 cal/g) (102), with one intermediate value of 105 J/g (25 cal/g) (20). The lower value, 80 J/g, was originally measured by thermal analysis and then correlated with a measure of crystallinity deterrnined by x-ray diffraction (36). The value of 146 J/g was deterrnined independendy on uniaxiaHy oriented PPS film samples by thermal analysis, density measurement via density-gradient column, and the use of a calculated density for 100% crystalline PPS to arrive at a heat of fusion for 100% crystalline PPS (102). The value of 105 J/g was obtained by measuring the heats of fusion of weU-characterized linear oligomers of PPS and extrapolation to infinite molecular weight. 

X-ray diffraction has been applied to spread monolayers as reviewed by Dutta [67] and Als-Nielsen et al. [68], The structure of heneicosanoic acid on Cu and Ca containing subphases as a function of pH has been reported [69], as well as a detailed study of the ordered phases of behenic acid [70], along with many other smdies. Langmuir-Blod-gett films have also been studied by x-ray diffraction. Some recent studies include LB film structure just after transfer [71], variations in the structure of cadmium stearate LB films with temperature [72], and characterization of the structure of cadmium arachidate LB films [73], X-ray [74,75] and neutron reflectivity [76,77] data on LB films can be used to model the density profile normal to the interface and to obtain values of layer thickness and roughness. 

It should be noted here that the barrier-film-promoting electrolytes are also characterized by VA(t) curves similar to those of the pore-forming ones, if comparatively small current densities are used (less than 0.5mA/cm2).20... 

This phenomenon, however, is not difficult to understand in view of the mechanism of dissolution under such conditions. Since the number of active sites increases linearly with current density and these sites are characterized by a film structure (or thickness or both) different from that at the OCP, one could expect corresponding increases in the corrosion rate. However, as was mentioned earlier, the active surface area in the pits increases with time, and hence one should expect the corrosion rate to increase correspondingly. Therefore, since the effect is not time dependent, one... 

The film electrodeposition process was studied by means of linear sweep voltammetry. The rate of electrochemical reaction was determined from current density (current-potential curves). The film deposits were characterized by chemical analysis, IR - spectroscopy, XRD, TG, TGA and SEM methods. 

For a given detector and a given pair of elements the last two factors give a single constant (Icab) that can be treated as a relative sensitivity factor. Both that factor and the method obtained their names after the two people who introduced them, Cliff and Lorimer (1975). The simplicity originates from the fact that the Uab factor does not depend either on the rest of elements also present in the sample or on the other parameters of the sample (thickness, density), as far as the thin film criterion is fulfilled. The Cliff-Lorimer factors can either be calculated using the known parameters of the detector or can be measured if a well-characterized thin film sample (standard) is available. In the first case the method is standardless. In the second case the known weight fractions and the measured intensity ratio provides the Cliff-Lorimer factor for the pair of elements. 

In thin film processes for microelectronic applications, we deal almost exclusively with glow discharges. These plasmas are characterized by pressures in the range of 50 mTorr to 5 Torr, electron densities between 10 and 10 cm , and average electron energies between 1 and 10 eV (such ener-... 

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