Atomic force microscopy Digital Instruments Multimode

Atomic Force Microscopy (AFM). We used an Digital Instruments MultiMode Ilia AFM in intermittant mode to avoid damage to the organic thin film. Conventional Si probes with opening angles of 20° and tip radii of less then 10 nm have been employed. The typical resonance frequency of the used cantilevers is 300 kHz and the force constant is about 40 N/m. 

Atomic Force Microscopy (ATM). A Nanoscope IIIA Multimode (Digital Instruments, Santa Barbara, CA) was used for atomic force microscopy measurements. The AFM was operated in force mode, with a scan rate of 1 Hz, and a 2 -piezo total displacement of 500 nm, without calibrating the scanner before each measurement (routine calibration only). Both ap-proach/extension and retraction force curves of the cantilever were recorded. 

Atomic Force Microscopy (AFM) and Transmuision Electron Microscopy (TEM). Measurements were carried out with a MultiMode AFM (Digit Instruments). The tapping mode was applied. The polymer was dissolved in 2,2,3,3-tetrafluoro-l-propanol or THF and a film was formed by slow evaporation of the solvent at ambient temperature. The samples for TEM were dissolved in water and in some cases colloidal gold was added. The solutions were cast onto copper grids covered with a carbon fihn. A Zeiss-CEM902 was used with an acceleration voltage of 80 kV. 

Atomic force microscopy (AFM) images were obtained using a Digital Instruments MultiMode scanning probe microscope with a NanoScope IVa controller (Veeco Instruments, Santa Barbara, CA) in tapping mode. A silicon probe (Veeco) with an end radius of <10 run and a force constant of 5 N/m was used to image sanples. Samples were dried under vacuum at 60 °C for 3 h and... 

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