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Atomic force microscopy development

Recent Developments in Rubber Research Using Atomic Force Microscopy... [Pg.581]

The success of STM has resulted in the development of a whole variety of related scanning probe microscopes, the most important of which is atomic force microscopy, AFM, also known as scanning force microscopy. AFM was first reported in 1986 by Binnig, Quate and Gerber. [Pg.88]

Cohen SH, Bray MT, Lightbody ML. Atomic Force Microscopy-Scanning Tunneling Microscopy. Proceedings of the first U.S. Army Natik Research Development and Engineering Center. Plenum Press, New York, 1995. [Pg.232]

Other more advanced microscopic techniques have been developed, including near-held scanning optical microscopy [166] and scanning probe microscopy techniques, such as atomic force microscopy and scanning tunnelling microscopy [166, 167],... [Pg.11]

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See also in sourсe #XX -- [ Pg.29 , Pg.30 ]



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