Atomic force microscopy , amorphous

The volume inside the semicrystalline polymers can be divided between the crystallized and amorphous parts of the polymer. The crystalline part usually forms a complicated network in the matrix of the amorphous polymer. A visualization of a single-polymer crystallite done [111] by the Atomic Force Microscopy (AFM) is shown in Fig. 9. The most common morphology observable in the semicrystalline polymer is that of a spherulitic microstructure [112], where the crystalline lamellae grows more or less radially from the central nucleus in all directions. The different crystal lamellae can nucleate separately... 

Silicomanganese, 15 556 low carbon, 15 555—556 world production of, 15 550—551t Silicomanganese, 22 519 Silicomanganese furnace, 15 553, 555 Silicomanganese production, 15 555—556 Silicon (Si), 9 731-733, 22 480-501, 502-511. See also Doped silicon re-type (negative) silicon p-type (positive) silicon Ribbon silicon Sheet silicon Amorphous silicon (a-Si) Si-hybrid sealants Silica entries analytical methods for, 22 498—499 in aluminum alloys, 22 508, 509, 510 applications of, 22 499, 508—509 atomic force microscopy of etching, 3 333-337... 

Atomic Force Microscopy Studies of Amorphous DNA Layers. 145... 

The morphology of this supramolecular diblock copolymer library has been investigated by means of atomic force microscopy (AFM) measurements. As illustrated in Fig. 21, at first glance different morphologies were obtained for different compositions. However, interpreting the phase behavior of supramolecular block copolymers is not straightforward. There are several important parameters that play a role in the phase behavior. For instance, the amorphous phase of PEG, the crystalline phase of PEG, the metal complex, and the amorphous PSt contribute to... 

Chen et al. [67,68] further extended the study of binary blends of ESI over the full range of copolymer styrene contents for both amorphous and semicrystalline blend components. The transition from miscible to immiscible blend behavior and the determination of upper critical solution temperature (UCST) for blends could be uniquely evaluated by atomic force microscopy (AFM) techniques via the small but significant modulus differences between the respective ESI used as blend components. The effects of molecular weight and molecular weight distribution on blend miscibility were also described. 

Zhang JX, Ebbens S, Chen XY, et al. Determination of the surface free energy of crystalline and amorphous lactose by atomic force microscopy adhesion measurement. Pharm Res 2006 23(2) 401 07. 

Physical characterization of macromolecular systems strives to determine chemical structure/property relationships. This subfield includes study of thermomechanical performance viscoelastic properties surface properties, adhesion science thermal transitions morphological analysis, including semicrystalline, amorphous, liquid-crystalline, and microphase-separated structures. Structural analysis employs electron microscopy, con-focal microscopy, optical microscopy, x-ray photoelectron spectroscopy, atomic force microscopy, and x-ray and neutron scattering of macromolecular compositions. 

In this section, we present the morphology development of neat elastomeric polypropylene as well as its blend with POE by means of optical microscopy and atomic force microscopy. ePP is essentially atactic polypropylene, which is amorphous in character, but contains some level of isotacticity (26). The incorporation of crystal-lizable iPP blocks provides the physical junctions to these amorphous ePP to possess elastomeric properties like a network in the solid state, but these crystal junctions can be removed upon melting, and thus affords melt processability like thermoplastics. 

Typical atomic force microscopy (AFM) and scanning electron microscopy (SEM) images of Te deposited on n-Si are presented in Fig. 2. At the first stages of Te deposition the separate particles with sizes of 104-40 nm are formed. Later, new particles appear and grow forming tendril-like structures. At longer times the deposit covers the whole substrate surface. According to x-ray diffraction (XRD) data, the amorphous product is formed. 

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