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Roughness average

Figure 4.21 Atomic force microscopy images showing the morphology of coloured Si02-PMM A hybrid coatings with molar ratio formulation of 1 0.5 1.0 TEOS-TMSPM MMA, with different concentrations and types of colour (a) no colour (b) 0.17 wt% of blue colour (c) 0.83 wt% of green colour. The values of the r.m.s. average roughness measured for the three films was 0.47, 0.65 and 0.45 nm, respectively. (Reproduced from ref. 21, with permission.)... Figure 4.21 Atomic force microscopy images showing the morphology of coloured Si02-PMM A hybrid coatings with molar ratio formulation of 1 0.5 1.0 TEOS-TMSPM MMA, with different concentrations and types of colour (a) no colour (b) 0.17 wt% of blue colour (c) 0.83 wt% of green colour. The values of the r.m.s. average roughness measured for the three films was 0.47, 0.65 and 0.45 nm, respectively. (Reproduced from ref. 21, with permission.)...
Table 4. Average roughness of NF90, NF270 and BW30 membranes... Table 4. Average roughness of NF90, NF270 and BW30 membranes...
Fig. 7.10. Maximum, root mean square, and average roughness Amax, Rq, and fta, respectively (derived from 10 X 10 pm2 AFM scans) of 300 nm thick ZnMgO films (PLD from a ZnO 4wt. %MgO target) on a-plane sapphire in dependence on oxygen partial pressure during PLD growth. Lowest film surface roughness is obtained around 10 3 mbar. The lines are drawn to guide the eye. Measured by G. Zimmermann... Fig. 7.10. Maximum, root mean square, and average roughness Amax, Rq, and fta, respectively (derived from 10 X 10 pm2 AFM scans) of 300 nm thick ZnMgO films (PLD from a ZnO 4wt. %MgO target) on a-plane sapphire in dependence on oxygen partial pressure during PLD growth. Lowest film surface roughness is obtained around 10 3 mbar. The lines are drawn to guide the eye. Measured by G. Zimmermann...
Fig. 7.11. AFM scan images (10x10pm2) of roughness optimized ZnO (top, 1.4 tm thick), ZnO 4wt. %MgO (center, 250nm thick on ZnO buffer), and MgO (bottom, 400 nm thick) films on a-plane sapphire with average roughness f a of 1.45, 0.41, and 1.23 nm, respectively. Measured by G. Zimmermann... Fig. 7.11. AFM scan images (10x10pm2) of roughness optimized ZnO (top, 1.4 tm thick), ZnO 4wt. %MgO (center, 250nm thick on ZnO buffer), and MgO (bottom, 400 nm thick) films on a-plane sapphire with average roughness f a of 1.45, 0.41, and 1.23 nm, respectively. Measured by G. Zimmermann...
Fig. 7.12. AFM scan images (10 x 10 pm2) of mobility optimized, 1.4 pm thick ZnO thin films on a-plane sapphire. The Hall mobility at 300 K correlates with the grain size. The average roughness and the carrier concentration are 12.5mm/1.6 x 1016 cm 3 (top) and 8.38nm/3.1 x 1016 cm 3 (bottom), respectively. Measured by G. Zimmermann... Fig. 7.12. AFM scan images (10 x 10 pm2) of mobility optimized, 1.4 pm thick ZnO thin films on a-plane sapphire. The Hall mobility at 300 K correlates with the grain size. The average roughness and the carrier concentration are 12.5mm/1.6 x 1016 cm 3 (top) and 8.38nm/3.1 x 1016 cm 3 (bottom), respectively. Measured by G. Zimmermann...
Figure 1.25. Effect of 50 kHz vibrations on the advancing contact angles of Hg and H20 on rough substrates with different values of the ratio Ra / Aa where Ra is the average roughness of the surface and Aa is the average wavelength of the surface features. In practice IORa/Aa tan/ . From (Hitchcock... Figure 1.25. Effect of 50 kHz vibrations on the advancing contact angles of Hg and H20 on rough substrates with different values of the ratio Ra / Aa where Ra is the average roughness of the surface and Aa is the average wavelength of the surface features. In practice IORa/Aa tan/ . From (Hitchcock...
Generally, smooth surfaces are more easily obtained with monocrystals. The same average roughness Ra can be obtained by mechanical polishing of polycrystals but this operation often leads to an accidental roughness on this type... [Pg.139]

Figure 26. STM images of zinc coatings and the average roughness of the observed hexagonal zinc crystals a) 20 pm, R = 0.252 nm, b) 25 pm, Ra = 0.264 nm, c) 60 pm, Ra = 0.185 nm. Scan size (50 x 50) nm. (Reprinted from Ref.18 with permission from the Serbian Chemical Society.)... Figure 26. STM images of zinc coatings and the average roughness of the observed hexagonal zinc crystals a) 20 pm, R = 0.252 nm, b) 25 pm, Ra = 0.264 nm, c) 60 pm, Ra = 0.185 nm. Scan size (50 x 50) nm. (Reprinted from Ref.18 with permission from the Serbian Chemical Society.)...
Figure 4a and 4b AFM scans of a copper wafer polished with plain and surfactant based alumina slurry (average roughness = 9 nm for 4a and =4 nm for 4b). [Pg.140]


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See also in sourсe #XX -- [ Pg.698 ]

See also in sourсe #XX -- [ Pg.188 , Pg.264 ]




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Center line average roughness

Roughness average value

Stainless Roughness Average

Surface roughness 78-80 average values obtained from

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