Accelerator mass spectrometry high energy analysis

The TOF mass analyzer has a low duty cycle, and the combination with an ion accumulation device such as an ion trap is therefore very advantageous. It offers also MS capabilities with accurate mass measurement. In all acquisition modes, the ions are accelerated into the time of flight for mass analysis. Various other hybrid mass spectrometers with TOF have been described, including quadrupole ion trap [70] and linear ion trap [58]. High energy tandem mass spectrometry can be performed on TOF-TOF mass spectrometers [71, 72]. 

Secondary ion mass spectrometry (SIMS) is a highly sensitive surface technique for characterizing materials. The procedure is based on the mass analysis of ions created when an impinging beam strikes the surface of a solid (or liquid, in a few special applications). The impinging ion beam, usually referred to as the primary ion beam, is generally accelerated to energies between 0.2 and 40 keV. Figure 4.1 shows the essential elements of SIMS. 

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