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X measurements

When there is significant random error in all the variables, as in this example, the maximum-likelihood method can lead to better parameter estimates than those obtained by other methods. When Barker s method was used to estimate the van Laar parameters for the acetone-methanol system from these data, it was estimated that = 0.960 and A j = 0.633, compared with A 2 0.857 and A2- = 0.681 using the method of maximum likelihood. Barker s method uses only the P-T-x data and assumes that the T and x measurements are error free. [Pg.100]

Quantitative Analysis Using the Method of Standard Additions Because of the difficulty of maintaining a constant matrix for samples and standards, many quantitative potentiometric methods use the method of standard additions. A sample of volume, Vx) and analyte concentration, Cx, is transferred to a sample cell, and the potential, (ficell)x) measured. A standard addition is made by adding a small volume, Vs) of a standard containing a known concentration of analyte, Cs, to the sample, and the potential, (ficell)s) measured. Provided that Vs is significantly smaller than Vx, the change in sample matrix is ignored, and the analyte s activity coefficient remains constant. Example 11.7 shows how a one-point standard addition can be used to determine the concentration of an analyte. [Pg.488]

If the tracer concentration is X measured at each sampling position that has its position at y, on a scale along the arc (either in degrees or in meters), estimates of the mean posiHon of the plume at ground level and the variance of the groundlevel concentration distribution are given by ... [Pg.313]

The cavity length, x measured from the lee side of the building, is estimated by the following (Hosker, 1984) ... [Pg.319]

Thus, the coordinate x measures the progress of the main reaction from R to P, whereas (y — j) is a measure of the perpendicular displacement from the pure concerted reaction path. [Pg.238]

The meaning attached to A is precisely that of the cpd at the metal/so-lution interface, i.e., X measures the change in

- X, includes a contribution from metal electrons and from solvent dipoles. While it may be difficult to compare the behavior of different metals, as Figs. 21 and 22 show, because of the lack of a parameter unambiguously... [Pg.178]

The fundamental quantity for interferometry is the source s visibility function. The spatial coherence properties of the source is connected with the two-dimensional Fourier transform of the spatial intensity distribution on the ce-setial sphere by virtue of the van Cittert - Zemike theorem. The measured fringe contrast is given by the source s visibility at a spatial frequency B/X, measured in units line pairs per radian. The temporal coherence properties is determined by the spectral distribution of the detected radiation. The measured fringe contrast therefore also depends on the spectral properties of the source and the instrument. [Pg.282]

An exponential and several polynomial models were applied, with the X measure of fit serving as arbiter. [Pg.164]

For simplicity, it is assumed that the equilibrium value of the macrostate is zero, x = 0. This means that henceforth x measures the departure of the macrostate from its equilibrium value. In the linear regime, (small fluctuations), the first entropy may be expanded about its equilibrium value, and to quadratic order it is... [Pg.11]

It is often useful to evaluate the differential along a curve s such as shown in Pig. 9. Let As be the length of the curve y — f(x) measured between points a and b and assume that s increases as increases. Thus, the derivative can be expressed as... [Pg.230]

Magnitude of an analytical quantity, x, measured at test samples on the one hand... [Pg.309]

Example 2-1 To convert a quantity X measured in feet to the equivalent in miles ... [Pg.19]

Figure 3. Ratios of the free to the total activity concentrations of RaA and RaB and fp as function of the attachment rate X measured in eight rooms of different houses. Figure 3. Ratios of the free to the total activity concentrations of RaA and RaB and fp as function of the attachment rate X measured in eight rooms of different houses.
Fig. 1.78.2. rice as a function of drying time. O—O, X—X measurements and repetition with the same product and the same process data, — Another product with other process data. [Pg.87]

Turbulent convective burning of vertical plate. An approximate solution matched to data was given by Ahmad and Faeth [11]. The average burning rate mp for a distance x measured from the start of the plate is given by the formula below ... [Pg.252]

X = Measure of the packing irregularities dp = Particle diameter, y = Tortuosity factor,... [Pg.433]

Figure 11.14 Effect of applied strain on the 002 d-spacing of a PTT fiber drawn at 3.3 x measured by WAXD [76], Reprinted from Polymer, 42, Wu, J., Schultz, J. M., Samon, K. M., Pangelinan, A. B. and Chuah, H. H., In situ study of structure development in poly(trimethylene terephthalate) fibers during stretching by simultaneous synchrotron small- and wide-angle X-ray scattering, 7141-7151, Copyright (2001), with permission from Elsevier Science... Figure 11.14 Effect of applied strain on the 002 d-spacing of a PTT fiber drawn at 3.3 x measured by WAXD [76], Reprinted from Polymer, 42, Wu, J., Schultz, J. M., Samon, K. M., Pangelinan, A. B. and Chuah, H. H., In situ study of structure development in poly(trimethylene terephthalate) fibers during stretching by simultaneous synchrotron small- and wide-angle X-ray scattering, 7141-7151, Copyright (2001), with permission from Elsevier Science...
Figure 6. Plot of tan 8 vs. temperature for plasma-polymerized ethane formed at 0.5 ton, 20 cmsSTP/min, 5 W, and KHz. Film thickness was 820 A. (9) Measured at 1 KHz and (X) measured at 10 KHz. Figure 6. Plot of tan 8 vs. temperature for plasma-polymerized ethane formed at 0.5 ton, 20 cmsSTP/min, 5 W, and KHz. Film thickness was 820 A. (9) Measured at 1 KHz and (X) measured at 10 KHz.
This chapter deals with the necessity of representative sampling in the context of PAT. All PAT sensors need to be calibrated with respect to relevant, reliable reference data (Y data). This presupposes that representative samples are at hand for this characterization - but sampled howl Additionally, X signals (X measurements) need to be qualified as representative of the same volume as was extracted for Y characterization, or at least a sufficiently well-matching volume. How does one demonstrate this in a quantitative manner If the quality of both X and Y data involved is suspect, how can a multivariate calibration be expected to be trustworthy This also includes the issue regarding proper validation of the chemometric multivariate calibration(s) involved, which can only be resolved based on proper understanding of the phenomenon of heterogeneity. The TOS delivers answers to all these issues. The TOS constitutes the missing link in PAT. [Pg.38]

Cl, Br [Pt(en)3] X- Measured outer-sphere association constants. Bromide interacts with [Pt(en)j] less strongly than Cl . Values higher than an earlier estimation e f... [Pg.438]

Figure 3. Maximum extent of reaction x measured with DSC at 20°C and at 80°C for various light intensities. TEGDA with 3.4 w% DMPA. Figure 3. Maximum extent of reaction x measured with DSC at 20°C and at 80°C for various light intensities. TEGDA with 3.4 w% DMPA.
The temperature dependence of magnetic susceptibility x measured on single crystals reveals magnetic ID behaviour. Below 50 K x is strongly anisotropic with the trigonal axis corresponding to the easy axis of magnetization and therefore to... [Pg.272]

LB deposition of the TTF-LBl amphiphile from an aqueous Mn+ subphase forms Y-type hlms with stoichiometry Mn2 (11L-LB1 )(H2 0)2. Static x measurements show that the hlms become magnetic near 11.5 K when the manganese phosphonate network orders as a canted antiferromagnet. This is illustrated in Fig. 6.44. [Pg.306]

There is an anomalous (approx flat) region observed in p(x) andp(x) measurements immediately following the deton front which (over a limited range of propagation) seems to grow in time (or with distance) from the point of initiation... [Pg.696]


See other pages where X measurements is mentioned: [Pg.1521]    [Pg.61]    [Pg.302]    [Pg.725]    [Pg.20]    [Pg.156]    [Pg.177]    [Pg.79]    [Pg.1066]    [Pg.301]    [Pg.307]    [Pg.170]    [Pg.172]    [Pg.24]    [Pg.187]    [Pg.13]    [Pg.295]    [Pg.170]    [Pg.160]    [Pg.328]    [Pg.216]    [Pg.44]    [Pg.273]    [Pg.502]    [Pg.52]    [Pg.2]    [Pg.102]   
See also in sourсe #XX -- [ Pg.423 ]




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Extended X-ray absorption fine structure EXAFS) measurements

Extended X-ray absorption fine structure measurment

Film stress from x-ray diffraction measurement

Hazard control measures for analytical x-ray systems

Measurement of x-ray intensity

Powder X-ray diffraction measurements

Solution X-ray scattering measurements

X-ray absorption measurements

X-ray absorption near edge structure measurement

X-ray diffraction measurements

X-ray intensity, measurement

X-ray measurements

X-ray photoelectron spectroscopy measurements

X-ray reflectivity measurements

X-ray scattering measurements

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