Vertical morphology characterization methods

Solid surfaces have been found to exhibit fractal morphology. A study of the quality and accuracy of the methods based on frequency analysis for the fractal characterization of solid surfaces was carried out by STM. The study was based on computer simulation of images of fractal surfaces. Measurement of the fractal character of a surface in the microscope range has specific problems. The most important is that the images of a given solid surface arise from the projections of the surface topography in which the vertical dimension is unknown, whereas from both STM and AFM we can obtain the vertical dimensions. 

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