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Uniform gas

As the width and thickness of IC layers and patterns continue to shrink into the submicrometer range, Si02 layers need to be fabricated of 5—20 nm thickness. These thin oxides have properties that are very sensitive to the substrate cleanliness and uniformity, gas purity, and temperature control. [Pg.347]

Fig. 3. Schematic of three commonly used types of MOCVD reactors where the arrows indicate gas flow (a) vertical rotating disk where (— represents an inlet to promote a laterally uniform gas flow, (b) planetary rotation, and (c) hori2ontal. Fig. 3. Schematic of three commonly used types of MOCVD reactors where the arrows indicate gas flow (a) vertical rotating disk where (— represents an inlet to promote a laterally uniform gas flow, (b) planetary rotation, and (c) hori2ontal.
On the expander side, the expander wheel is surrounded by the nozzle vanes. The nozzle vanes, in turn, reeeive gas from a toroidal spaee that is eonneeted to tlie expander inlet piping. Any non-uniformity in the torus spaee and/or in the nozzle vane design may result in a non-uniform pressure distribution around the expander wheel. Non-uniform gas pressure around the expander wheel will result in a non-uniform load and, henee, produee a gas dynamie radial load on the bearing. In the expander ease, however, the nozzle throat flow resistanee is mueh larger than the easing peripheral pressure nonuniformity. The latter aets as a buffer making the expander wheel eireumferential pressure variations smaller than those of the eompressor side. This smaller pressure variation produees mueh less radial load when eompared to that of the eompressor side. [Pg.482]

Both extreme models of surface heterogeneity presented above can be readily used in computer simulation studies. Application of the patch wise model is amazingly simple, if one recalls that adsorption on each patch occurs independently of adsorption on any other patch and that boundary effects are neglected in this model. For simplicity let us assume here the so-called two-dimensional model of adsorption, which is based on the assumption that the adsorbed layer forms an individual thermodynamic phase, being in thermal equilibrium with the bulk uniform gas. In such a case, adsorption on a uniform surface (a single patch) can be represented as... [Pg.251]

To make matters worse, the use of a uniform gas model for electron density does not enable one to carry out good calculations. Instead a density gradient must be introduced into the uniform electron gas distribution. The way in which this has been implemented has typically been in a semi-empirical manner by working backwards from the known results on a particular atom, usually the helium atom (Gill, 1998). It has thus been possible to obtain an approximate set of functions which often serve to give successful approximations in other atoms and molecules. As far as I know, there is no known way of yet calculating, in an ab initio manner, the required density gradient which must be introduced into the calculations. [Pg.105]

Variation of bubble size, bubble frequency, and the standard deviation of -APbed with variation of Ug in the conical fluidized beds with a uniform gas distributor (Fopen = 3.87 %) is shown in Fig. 7. As can be seen, the standard deviation of - APbed and the bubble size increase with increasing Ug in the fully fluidized region. However, bubble frequency remains unchanged with variation of Ug that may imply the bubble size will increase as much as the volumetric gas flow increases. As shown, the bubble size dramatically increases with increasing Ug. Also, it is confirmed that the increase of standard deviation of -APbed is closely related to bubble size. [Pg.559]

Using three-dimensionally structured adsorbent with a large number of uniform gas channels, the limitations of mass transfer kinetics and fluidization of the conventional beaded sorbents may be removed. Such structured adsorbents have been described in... [Pg.292]

For the simulations we use a 2D TFM as described in the previous sections. The simulation conditions are specified in Table V. The gas flow enters at the bottom through a porous distributor. The initial gas volume fraction in each fluid cell is set to an average value of 0.4 and with a random variation of + 5%. Also for the boundary condition at the bottom, we use a uniform gas velocity with a superimposed random component (10%), following Goldschmidt et al. (2004). [Pg.128]

The performance of a reactor for a gas-solid reaction (A(g) + bB(s) -> products) is to be analyzed based on the following model solids in BMF, uniform gas composition, and no overhead loss of solid as a result of entrainment. Calculate the fractional conversion of B (fB) based on the following information and assumptions T = 800 K, pA = 2 bar the particles are cylindrical with a radius of 0.5 mm from a batch-reactor study, the time for 100% conversion of 2-mm particles is 40 min at 600 K and pA = 1 bar. Compare results for /b assuming (a) gas-film (mass-transfer) control (b) surface-reaction control and (c) ash-layer diffusion control. The solid flow rate is 1000 kg min-1, and the solid holdup (WB) in the reactor is 20,000 kg. Assume also that the SCM is valid, and the surface reaction is first-order with respect to A. [Pg.560]

If the main limitations of HF theory are overcome by the introduction of electron correlation, those of density functional theory are expanded by the use of more accurate functionals. These functionals, that improve the uniform gas description of the LDA approach, are labeled as non-local or Generalize Gradient Approximation (GGA). [Pg.10]

Diffusion medium properties for the PEFC system were most recently reviewed by Mathias et al. The primary purpose of a diffusion medium or gas diffusion layer (GDL) is to provide lateral current collection from the catalyst layer to the current collecting lands as well as uniform gas distribution to the catalyst layer through diffusion. It must also facilitate the transport of water out of the catalyst layer. The latter function is usually fulfilled by adding a coating of hydrophobic polymer such as poly(tet-rafluoroethylene) (PTFE) to the GDL. The hydrophobic polymer allows the excess water in the cathode catalyst layer to be expelled from the cell by gas flow in the channels, thereby alleviating flooding. It is known that the electric conductivity of GDL is... [Pg.492]

Since the uniform electron density is perfectly neutralized by a rigid uniform positive background, the total energy per electron of the uniform gas is just + xe, where the non-interacting kinetic energy is... [Pg.17]

Only the Stoll and FT expressions display the proper - 0 limit, but neither of these expressions seems correct in the range 1 < r, < < . With a satisfactory spin resolution of the correlation energy, it should be possible by the approach of Ref [57] to construct a satisfactory spin resolution of the pair correlation function of the uniform gas at all r, (or by the approaches of Refs. [49] and [53] for most r, of interest). We note that the formula... [Pg.24]

The solid curve was obtained from Yasuhara s expression for the on-top hole for a uniform electron gas [55]. The circles indicate the LSD values of /< (0)>- Their proximity to the uniform-gas curve indicates that the approximation... [Pg.14]

Fig. 6. Universal curve for the system-averaged on-top hole density in spin-unpolarized systems. The solid curve is for the uniform gas. The circles indicate values calculated within LSD, while the crosses indicate essentially exact results, and the plus signs indicate less accurate Cl results. The high-density (r, - 0) and low-density (r, ->oo) limits behave respectively like the weak-coupling U - 0) and strong-coup-ling (X- oo) limits... Fig. 6. Universal curve for the system-averaged on-top hole density in spin-unpolarized systems. The solid curve is for the uniform gas. The circles indicate values calculated within LSD, while the crosses indicate essentially exact results, and the plus signs indicate less accurate Cl results. The high-density (r, - 0) and low-density (r, ->oo) limits behave respectively like the weak-coupling U - 0) and strong-coup-ling (X- oo) limits...
We focus on the correlation energy only, as all the exchange energy is in the parallel-spin channels. Before we consider the question of locality of the different spin contributions, we first note that, contrary to assumptions in the literature [69,70], while the antiparallel contribution is typically most of the correlation energy, the parallel contribution is often not negligible. For spin-unpolarized systems, if JV = 2, all the correlation is antiparallel, while for A->oo in the uniform gas, only 60% is antiparallel. As far as we know, all other spin-unpolarized systems fall between these two extremes. As we report below, for Ne, a full 24% of the correlation energy is in the parallel-spin channels. [Pg.24]

Let us now turn to a number of frequently met contacting patterns, and let us develop their performance equations, employing in every case the assumptions of uniform gas composition within the reactor. [Pg.591]


See other pages where Uniform gas is mentioned: [Pg.188]    [Pg.401]    [Pg.248]    [Pg.1212]    [Pg.2394]    [Pg.32]    [Pg.83]    [Pg.557]    [Pg.455]    [Pg.476]    [Pg.557]    [Pg.619]    [Pg.567]    [Pg.567]    [Pg.568]    [Pg.136]    [Pg.7]    [Pg.218]    [Pg.36]    [Pg.458]    [Pg.460]    [Pg.466]    [Pg.16]    [Pg.22]    [Pg.22]    [Pg.72]    [Pg.5]    [Pg.11]    [Pg.12]    [Pg.15]    [Pg.15]    [Pg.19]    [Pg.181]   
See also in sourсe #XX -- [ Pg.298 , Pg.305 ]




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