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Tracks pitch

Tracer technology Tracheography Trachoma Track pitch Traction Tractors... [Pg.1005]

Fig. 1. Progress in track pitch, t (A) and bit cell length, / (B) implemented in disk files up to 1990. The possible changes in dimensions to obtain commercial... Fig. 1. Progress in track pitch, t (A) and bit cell length, / (B) implemented in disk files up to 1990. The possible changes in dimensions to obtain commercial...
Green strength may be determined by measuring the lateral force that bonded parts can withstand. In one test method (Siemens Standard SN 59651)," a populated board is allowed to slide down an incline to a stop at the base, and the displacement of components on the board is measured (Figure 5.4). An acceleration run of 400 mm from a height of 35 mm is made. A maximum shift of 0.15 mm (50% of the track pitch for a standard 0.3 mm pitch part) is considered acceptable. ... [Pg.219]

Master disk with 30nm groove width and track-pitch accuracy of 1.5 nm... [Pg.8]

One of the reasons why CD-audio and CD-ROM have become so successful is the strict, uniform standards that all of the manufacturers of these products have adhered to. The standards were drawn up by Philips and Sony and are described by the colors of the books that they were first printed in. The standards describing CD-audio are found in the Red Book, those describing CD-ROM are found in the Yellow book, and those describing CD-R are found in the Orange Book. These books describe the physical attributes that the disks must meet (such as reflectivity, track pitch, etc.), as well as they layout of recorded data (Bouwhuis et al, 1985). [Pg.1601]

Track pitch shifting information is also displayed in this area of the track. (See Chapter 9 for a discussion of loop and track types.)... [Pg.26]

Figure 54(b)). According to eqn (25], the theoretical lateral resolution would be 27.7 pm and Figure 54(b) demonstrates that the track pitch maxima can be resolved up to about 20 pm. [Pg.292]

Figure 54 F-IR imaging of Novolac-coated silicon wafers with iaser-induced grooves of different track pitches, (a) F-iR spectra of original (red) irradiated (green) silicon wafer area (b) F-IR images for different track pitches (red, nonirradiated area green, irradiated area). Figure 54 F-IR imaging of Novolac-coated silicon wafers with iaser-induced grooves of different track pitches, (a) F-iR spectra of original (red) irradiated (green) silicon wafer area (b) F-IR images for different track pitches (red, nonirradiated area green, irradiated area).

See other pages where Tracks pitch is mentioned: [Pg.142]    [Pg.142]    [Pg.170]    [Pg.605]    [Pg.615]    [Pg.142]    [Pg.142]    [Pg.170]    [Pg.297]    [Pg.431]    [Pg.337]    [Pg.263]    [Pg.411]    [Pg.8]    [Pg.9]    [Pg.364]    [Pg.255]    [Pg.292]   
See also in sourсe #XX -- [ Pg.339 ]




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