Thin film characterization adsorbed proteins

Abstract The technique of Fourier transform infrared reflection absorption spectroscopy (FT-IRAS) has been used to characterize thin films of proteins and amino acids formed on metal surfaces. The films were spontaneously adsorbed from solution onto each metal. All infrared spectra were taken on dried films. The infrared spectra were obtained by reflecting the radiation from the film covered surface at a high angle of incidence ( 75°) and with the radiation polarized parallel to the plane of incidence. 

Other techniques that are used for surface characterization of polymer/HAp nanomaterials include ellipsometry which enables measurement of the thicknesses and composition of the layers in a multilayer thin film, especially if the experiment is performed over a range of wavelengths of the incident beam or a range of angles of incidence. In addition, ellipsometry is frequently applied to characterization of the thickness of proteins adsorbed on gradient surfaces [309],... 

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