Thin bonded films, measurements

Fig. 8.1 shows both the schematic and a picture of an integrated IPMC-PVDF structure. A thin PVDF film (30 /im thick, Measurement Specialties Inc., Hampton, VA) is bonded to an IPMC actuator with an insulating PVC layer in between. The bonding can be achieved with the Fast-Cure... 

Sections of ceramic samples are often subjected to microprobe analyses or SEM examinations with an accessory device for energy-dispersive X-ray analysis. It is essential to avoid the introduction of any elements which are intended to be measured in these examinations or which may have a disruptive influence on them. It is therefore essential to pay special attention to swarf from metal-bonded diamond wheels, composite disks, or disks made of cast iron, lead, copper, or tin, as this swarf may accumulate in pores or in the form of thin surface films. This also applies to swarf from the sample and polish residue, which may remain on the sample after final polishing with alumina, for example. 

The stability of the electrical parameters after ageing at high temperature under power is of prime importance in the selection of die attach adhesives. The test requires a current density of 139.5 A cm applied to five gold-plated Kovar tabs, each tab being adhesively bonded to thin film gold conductors and series bonded with gold wires. The biased test specimens are heated at 150°C in nitrogen for 1000 h, and the electrical resistance of the bonds is measured at 25°C at 200 h intervals. The specification requirement states that the resistance of the five tabs does not increase more than 5%. 

FT-IR spectroscopy over a wavelength range 550-4000 cm-i with attenuated total reflection (ATR) module. Prior to measurements, the samples ought to be well dried (e.g., vacuum, T = 80°C). Thin, cast films or KBr pellets may be used. It is noteworthy that IR spectroscopy detects functional or polar bonds, e.g., C=0,0-H, etc. 

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