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The Ion Spectroscopies

Secondary ion mass spectrometry (SIMS) Secondary neutral mass spectrometry (SNMS) Ion-scattering spectroscopy (ISS) [Pg.85]

Techniques based on the interaction of ions with solids, such as secondary ion mass spectrometry (SIMS) and low-energy ion scattering (LEIS) have undoubtedly been accepted in catalyst characterization, but are by no means as widely applied as for example X-ray photoelectron spectroscopy (XPS) or X-ray diffraction (XRD). Nevertheless, SIMS, with its unsurpassed sensitivity for many elements, may yield unique information on whether or not elements on a surface are in contact with each other. LEIS is a surface technique with true outer layer sensitivity, and is highly useful for determining to what extent a support is covered by the catalytic material. Rutherford backscattering (RBS) is less suitable for studying catalysts, but is indispensable for determining concentrations in model systems, where the catalytically active material is present in monolayer (ML)-like quantities on the surface of a flat model support. [Pg.85]

In this chapter we describe briefly the physical phenomena, such as sputtering, scattering, neutralization, and reionization that are involved in ion spectroscopy. For a detailed description of the interactions of ions with solids, the reader is referred to the textbooks by Feldman and Mayer [1], Benninghoven, Riidenauer and Werner [2], and Czanderna and Hercules [3]. [Pg.86]

Secondary Ion Mass Spectrometry (SIMS) Secondary Neutral Mass Spectrometry (SNMS) Rutherford Backscattering (RBS) [Pg.79]

LEIS and RBS have in common that they all are ion in-ion out techniques. However, the physical phenomena underlying these techniques are entirely different SIMS is based on the sputtering action of the incident ion beam, LEIS on [Pg.79]


In situ methods permit the examination of the surface in its electrolytic environment with application of the electrode potential of choice. Usually they are favored for the study of surface layers. Spectroscopic methods working in the ultra high vacuum (UHV) are a valuable alternative. Their detailed information about the chemical composition of surface films makes them an almost inevitable tool for electrochemical research and corrosion studies. Methods like X-ray Photoelectron Spectroscopy (XPS), UV Photoelectron Spectroscopy (UPS), Auger Electron Spectroscopy (AES) and the Ion Spectroscopies as Ion Scattering Spectroscopy (ISS) and Rutherford Backscattering (RBS) have been applied to metal surfaces to study corrosion and passivity. [Pg.289]

This approach has recently been applied to the ion spectroscopy. 2.2. Increasing the Sensitivity... [Pg.368]


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Ion spectroscopy

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