Techniques used for the characterization of nanocomposites

Although XRD offers a convenient method to determine the interlayer spacing of the silicate layers in the original layered silicates and in the intercalated nanocomposites (within 1-4 nm), little can be said about the spatial distribution of the silicate layers or any structural nonhomogeneities in nanocomposites. Additionally, some layered silicates initially do not exhibit well-defined basal reflections. Thus, peak broadening and intensity decreases are very difficult to study systematically. Therefore, conclusions concerning the mechanism of nanocomposites formation and their structure based solely on 

XRD patterns are only tentative. On the other hand, TEM allows a qualitative understanding of the internal strueture, spatial distribution and dispersion of the nanopartilees within the polymer matrix, and views of the defect structure through direct visualization. However, special care must be exercised to guarantee a representative cross section of the sample. 

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