Techniques for Evaluation of Metal Surfaces

Analytical techniques for the identification of the structure and chemistry of solid surfaces are based on detection of particles photons, electrons, and ions. The techniques are classified according to the particles or radiation used to excite the sample and detected particles (emission) to obtain information about the sample. Fig. 4.5 schematically shows the interaction of the excitation sources with the solid surfaces of materials various forms of energy are emitted from the solid surfaces and detected by energy analyzers. 

Photons, electrons, ions Photons, electrons, ions 

In Table 4.6 some analytical techniques are summarized in terms of their input and measured radiations (Briggs and Seah, 1990 and 1992 Bubert and Janett, 2002 Miyoshi and Chung, 1993 Watts, 1990). 

Electrons Auger Electron Spectroscopy, Extended X-Ray Absorption Fine Structure, Low-Energy Electron Diffraction, Scanning Electron Microscopy, Surface Extended X-Ray Absorption Fine Structure, Ultraviolet Photoelectron Spectroscopy, X-Ray Absorption Near Edge Fine Structure, and X-Ray Photon Spectroscopy. 

Ions Ion Scattering Mass Spectroscopy, Laser Microprobe Mass Analyzer, Rutherford Backscattering Spectroscopy, Secondary Ion Mass Spectroscopy. 

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