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TappingMode™ atomic force microscopy

Nnebe I, Schneider JW. Characterization of distance-dependent damping in tappingmode atomic force microscopy force measurements in liquid. Langmuir. 2004 20(8) 3195-201. [Pg.129]

Bar G, Thomann Y. Characterization of the morphologies and nanostructures of blends of poly(styrene)-block-poly(ethene-co-but-l-ene)-block-poly(styrene) with isotactic and atactic polypropylenes by tappingmode atomic force microscopy. Langmuir 1998 14 1219-26. [Pg.38]

Measurements by Atomic Force Microscopy (in tappingmode, using a standard silicon tip with a radius of 10 nm) of the surface topography of both the lower and the upper interface (the surface of the aluminum electrode and that of the polymer film, respectively) revealed a typical root-mean square roughness of 3 nm or less... [Pg.34]

See other pages where TappingMode™ atomic force microscopy is mentioned: [Pg.366]    [Pg.366]    [Pg.4]    [Pg.77]    [Pg.561]    [Pg.50]    [Pg.5]   


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