Synchrotron radiation photoelectron surface specificity

Among the related methods, specific experimental designs for applications are emphasized. As in-system synchrotron radiation photoelectron spectroscopy (SRPES) will be applied below for chemical analysis of electrochemically conditioned surfaces, this method will be presented first, followed by high-resolution electron energy loss spectroscopy (HREELS), photoelectron emission microscopy (PEEM), and X-ray emission spectroscopy (XES). The latter three methods are rather briefly presented due to the more singular results, discussed in Sections 2.4-2.6, that have been obtained with them. Although ultraviolet photoelectron spectroscopy (UPS) is an important method to determine band bendings and surface dipoles of semiconductors, the reader is referred to a rather recent article where all basic features of the method have been elaborated for the analysis of semiconductors [150]. 

In addition to experiments at the FHI in surface vibrational spectroscopy, with Brian Hayden and Horst Conrad, and in low temperature STM with Erhard Schweizer, Beat Briner and Hans-Peter Rust, Bradshaw embarked upon three lines of research that specifically took advantage of the availability of synchrotron radiation sources. The first, a long-running application of energy scan photoelectron diffraction to the study of adsorbed molecules and molecular fragments in collaboration with Phillip Woodruff of the University of Warwick, made extensive use of the BESSY facilities and earned Bradshaw and Woodruff the Max Planck Research Prize in 1994. Although photoelectron diffraction had... 

---