Synchrotron-based microtomography

In this chapter, we discuss synchrotron X-ray microprobe and microtomography instrumentation, practical aspects of pXRF, pXAFS and microtomography, and examples of applications to earth and environmental materials. Other discussions of synchrotron-based microprobe and microtomography techniques can be found in the following references Dunsmuir et al. 1991 Janssens et al. 1993 Sutton et al. 1994 Schulze and Bertsch 1995 Smith and Rivers 1995 Jones et al. 1997 Sutton and Rivers 1999 Rivers et al. 1999 Bertsch and Hunter 2001 Baker 2002. 

Figure 6 Schematic view of a typical synchrotron-based computed microtomography setup.

Peth, S., R. Horn, F. Beckmann, T. Donath, J. Fischer, and A. J. M. Smucker. 2008. Three-dimensional quantification of intra-aggregate pore-space features using synchrotron-radiation-based microtomography. Soil Science Society of America Journal 72, no. 4 897. doi 10.2136/sssaj2007.0130. 

Abstract This chapter deals with the analytical applications of synchrotron radiation sources for trace-level analysis of materials on microscopic and submicroscopic scales. Elemental analysis with X-ray fluorescence is described in detail. Two-dimensional (2D) and three-dimensional (3D) analyses are discussed in their quantitative aspects. Related methods of analysis based on absorption edge phenomena such as X-ray absorption spectrometry (XAS) and near-edge scanning spectrometry (XANES) yielding molecular information, computerized X-ray fluorescence microtomography (XFCT) based on the penetrative character of X-rays, and microscopic X-ray diffraction (XRD) providing structural data on the sample are also briefly discussed. The methodological treatment is illustrated with a number of applications. 

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