Surface characterization adhesion bonding, SIMS

Ion beams provide useful information either as a diagnostic tool or as a precision etching method in. adhesive bonding research. The combination of SIMS with complementary methods such as ISS or AF.S provides a powerful tool for elemental end limited structural characterization of metals, alloys and adhesives. The results shown here indicate that surface chemistry (and interface chemistry) can be decidedly different from bulk chemistry. Often it is this chemistry which governs the quality and durability of an adhesive bond. These same surface techniques also allow an analysis of the locus of failure of bonded materials which fail in service or test. 

The outline of this chapter is as follows. The spectroscopic techniques that can be used for surface of interface characterization of adhesively bonded materials are listed in Table 1. The most popular techniques are then discussed briefly in terms of the type of information they provide and where they can be applied. Their limitations are also described briefly. Since just a handful of techniques are used on a regular basis, notably XPS, AES, SIMS, FTIR, and Raman spectroscopy, only these techniques will be discussed in detail. Recent and ongoing instrumental developments are described and specific applications of each of these techniques are presented and discussed. Finally, a bibliography containing many references to textbooks and important artieles is given. 

The techniques highlighted here are XPS, AES, SIMS, various forms of FTIR, Raman spectroscopies, and HREELS. This selection is based on their relative ease of application and interpretation, their commercial availability, and the unique capabilities that each technique possesses for the study of an aspect of adhesive bonding. These capabilities are also highly complementary. The applications discussed are chosen to illustrate the applications in three major areas described earlier surface characterization, modification of metal or polymer surfaces, and analysis of interfaces. 

W. L. Baun, "Study of Adhesive Bonding and Bond Failure Surface Using ISS-SIMS," in Characterization of Metal and Polymer Surfaces. Vol. I, L. H. Lee, ed., pp. 375-390, Academic Press, New York (1977). 

A brief review of each technique will be followed by a discussion of results illustrating the application of the particular technique to adhesion. Examples are given of surface characterization of pretreated adherends, adhesive/adherend interactions, failure surface analysis, and correlation of these results to bond performance. Good summaries of the four major surface analytical techniques, namely XPS, AES, ISS, and SIMS, are given by Hercules(5) and Hofmann.( ) (See also Chapter 6 by Davis.)... 

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