Surface analysis principles

As on previous occasions, the reader is reminded that no very extensive coverage of the literature is possible in a textbook such as this one and that the emphasis is primarily on principles and their illustration. Several monographs are available for more detailed information (see General References). Useful reviews are on future directions and anunonia synthesis [2], surface analysis [3], surface mechanisms [4], dynamics of surface reactions [5], single-crystal versus actual catalysts [6], oscillatory kinetics [7], fractals [8], surface electrochemistry [9], particle size effects [10], and supported metals [11, 12]. 

Because surface science employs a multitude of teclmiques, it is necessary that any worker in the field be acquainted with at least the basic principles underlying tlie most popular ones. These will be briefly described here. For a more detailed discussion of the physics underlymg the major surface analysis teclmiques, see the appropriate chapter m this encyclopedia, or [49]. 

An introduction to the principles behind SPI-SALI, this ankle presents a theoretical discussion of why SPI-SALI is much less fragmenting than MPI-SALI. Examples are shown which describe the additional fragmentation induced by the desorption beam—in this case ESD is compared to ion sputtering. The main focus of the article is the advantages of SPI-SALI for surface analysis of bulk organic polymers. 

Surface and Thin Film Analysis Principles, Instrumentation, Applications 11... 

Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) are the two principle surface analysis techniques. They are used to identify the elemental composition, i.e., the amount and nature of species present at the surface to a depth of about 1 nm. 

Then we discuss the principles involved in the measurements of surface-specific physical quantities. Since each of the many techniques of surface analysis is sensitive to a few particular aspects of the surface (such as relative atomic positions, electronic levels, chemical composition, binding energies and vibration frequencies), we classify these techniques according to the surface characteristic that they are most sensitive to. 

Cutting across the domains of the various techniques mentioned above, are the model calculations l These are theoretical attempts to predict the structure of surfaces from first principles. The model calculations differ from the theories mentioned in conjunction with the experimental techniques listed above, in that the former are not primarily designed to describe the interaction of a probe with a surface, although obviously much overlap exists. Thus the calculation of electronic states at surfaces seeks to describe from first principles a situation (the structure of the surface) that is analyzed experimentally by any of the techniques mentioned above, using external probes but some of these techniques also involve the motion of electrons througli the surface region this motion in turn is clearly related to the electronic structure of the surface, and so the first-principles calculation and the surface-analysis technique may have and often do have much in common. 

If the sample is a conductor, it is possible to use it as the cathode of a spectral lamp whose principle of operation is identical to that described for hollow cathode lamps (cf. section 14.5 and Fig. 15.3). The device must be sealed before it can be used, which represents a technical constraint. The advantage of this process, which is commonly used for surface analysis, is that it produces spectra with narrow emission lines because atomisation is made at a lower temperature than with the electrical arc method. 

This paper is a synopsis of the introductory lecture at the American Chemical Society Symposium on "Industrial Applications of Surface Analysis." Following a review of the objectives of surface analysis, an outline is given of the design principles for measurements to achieve these objectives. Then common techniques for surface analysis are surveyed briefly. An example of the application of these techniques in microelectronics is indicated. The paper concludes with an assessment of the major advances in surface analysis during the past decade and an indication of the major current trends which could lead to comparable advances during the coming decade. 

The main purpose of this Introductory lecture is to set the stage for the detailed papers which follow by indicating broadly the objectives, principles and methods of modern surface analysis. A secondary objective is to provide some perspective on the major developments in modern surface analysis methods during the past decade, and on the prospects for their future development during the coming decade. 

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