Structure of Nominally Undoped PLD ZnO Thin Films

The structure of the PLD grown ZnO thin films on c-plane, a-plane, and r-plane sapphire substrates will be explained by results of X-ray diffraction (XRD), transmission electron microscopy (TEM) with selected area diffraction patterns (SAD), and reflection high-energy electron diffraction (RHEED). 

Tilt along Surface normal (°) None None 0.34 

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