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Stress cycling tests

X 10 stress cycles. Test results showed load resistance and rolling life to be in the following order (best to worst) silicon nitride, zirconia, silicon carbide, and then alumina. [Pg.314]

Stress cycling tests in imnotched samples do not readily distinguish between crack initiation and crack propagation. Further progress requires a similar approach to that adopted in fracture studies, namely the introduction of very sharp initial cracks in order to examine crack propagation utilizing fracture mechanics concepts. [Pg.331]

Here is the number of cycles to fracture under the stress cycle in region i, and Nj/Nf is the fraction of the lifetime used up after N, cycles in that region. Failure occurs when the sum of the fractions is unity (eqn. (15.4)). This rule, too, is an empirical one. It is widely used in design against fatigue failure but if the component is a critical one. Miner s Rule should be checked by tests simulating service conditions. [Pg.150]

The fatigue strength of most TPs is about 20 to 30% of the ultimate tensile strength determined in the short-term test but higher for RPs. It decreases with increases in temperature and stress-cycle frequency and with the presence of stress concentration peaks, as in notched components. [Pg.83]

Fatigue tests are normally performed by applying one of the stress cycles described above until the test specimen fractures. The number of cycles to failure, Nf, at a... [Pg.429]

Figure 11. Mechanical stress-strain behavior of four strips cut from a cell after a RH cycling test of 50 cycles from 0-100% RH the blue spots marked on the MEA are leaking locations identified by a bubble test after the RH cycling the insert shows the fracture location ofeach strip. Figure 11. Mechanical stress-strain behavior of four strips cut from a cell after a RH cycling test of 50 cycles from 0-100% RH the blue spots marked on the MEA are leaking locations identified by a bubble test after the RH cycling the insert shows the fracture location ofeach strip.
Types of tests. Laboratory corrosion fatigue tests can be classified as either cycles-to-failure (complete fracture) or crack propagation (crack growth) test. In cycles-to-failure testing, specimens or parts are subjected to a sufficient number of stress cycles to initiate and propagate cracks until complete fracture occurs. Such data are usually obtained by... [Pg.420]

Testing conditions (stresses, temperatures, environments) will ultimately have to match up with service conditions. If flexural stresses are expected in service, then a flexural test is one that should be performed as part of the test suite. If thermal or stress cycles are expected, then simulation of these conditions should also be included in the evaluation of the material. [Pg.394]

Figures 2 and 3 show that the DRAM chip perforMance has been iMproved even though the chip functionality has increased for the accelerated tests used by the seMiconductor industry. The 85 C/85X RH results are better because of a coMbination of iMproveMents in the chip design, the Manufacturing procedures and the epoxy encapsu-lent. The teMperature cycle test results, however, were priMarily improved by converting to a "low stress" epoxy encapsulant. The im-proveMent in the pressure cooker and the 125 C operating life (Figure 3) was also due to a coMbination of iMproveMents, including those in the epoxy encapsulant. These iMproveMents in device reliability are especially reMarkable when it is realized that the chip susceptibility to contaminants and stress has increased tremendously due to the 60-fold increase to functionality. Figures 2 and 3 show that the DRAM chip perforMance has been iMproved even though the chip functionality has increased for the accelerated tests used by the seMiconductor industry. The 85 C/85X RH results are better because of a coMbination of iMproveMents in the chip design, the Manufacturing procedures and the epoxy encapsu-lent. The teMperature cycle test results, however, were priMarily improved by converting to a "low stress" epoxy encapsulant. The im-proveMent in the pressure cooker and the 125 C operating life (Figure 3) was also due to a coMbination of iMproveMents, including those in the epoxy encapsulant. These iMproveMents in device reliability are especially reMarkable when it is realized that the chip susceptibility to contaminants and stress has increased tremendously due to the 60-fold increase to functionality.
Finite element model analysis simulating the thermal cycle tests demonstrated that the top coat spallation of both types of coating is caused by the buckling driven by delamination due to the transient large in-plane compressive stress development immediately after initiate heating. [Pg.418]


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See also in sourсe #XX -- [ Pg.435 ]




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