Stickle, William

Blackstock JJ, Donley CL, Stickle WF, Ohlberg DA, Yang JJ, Stewart DR, Williams RS (2008) Oxide and carbide formation at titanium/organic monolayer interfaces. J Am Chem Soc 130 4041 1047... [Pg.210]

The authors wish to thank Steve Flexser of Lawrence Berkeley Laboratory who prepared samples and William Stickle of the Perkin Elmer Surface Analytical Laboratory who performed the XPS analysis. This work was supported by the U.S. Nuclear Regulatory Commission. [Pg.597]

Blackstock JJ, Stickle WF, Donley CL, Stewart DR, Williams RS (2007) Internal structure of a molecular junction device chemical reduction of Pt02 by Ti evaporation onto an interceding organic monolayer. J Phys Chem C 111 16-20... [Pg.268]

R. PETER STICKLES, Consultant, Concord, Massachnsetts WILLIAM J. WALSH, Pepper Hamilton LLP, Washington, D.C. [Pg.5]

Teddington Dr. William Stickle Hewlett-Packard [Pg.912]

Z. Li, W.M. Tong, W.F. Stickle, D.L. Neiman, R.S. Williams, L.L. Hunter, A.A. Talin, D. Li, S.R.J. Brueck, Plasma-induced formation of Ag nanodots for ultra-high-enhancement surface-enhanced Raman scattering substrates. Langmuir 23, 5135 (2007)... [Pg.55]

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