Static SIMS spectra

Figure 4.11. Cesium ion initiated static SIMS spectra of platinum species on fresh auto-exhaust catalyst.

Figure 4.8 Positive static SIMS spectra of a MoCVSiCtySiOOO) model catalyst, after impregnation (lop) and after sulfidation in 10% H2S in H2 at the indicated temperatures, showing the transition from M0O3 to MoSj. The patterns are those of Mo+ (92-100 amu), MoO+ (108-116), MoS+ + Mo02+ (124-132) (from de Jong et al. [21J).

Figure 9.1 Positive (left) and negative (right) static SIMS spectra of RhCI3 x H20 on tantalum (top) and of a model catalyst prepared by adsorbing Rh complexes derived from RhCI( x H20 in water on an AljOj/Al model support (from Borg etal. [4]).

B. A. Carlson, J. G. Newman, W. Katz, R. S. Michael and W J. van Ooij, Handbook of Static SIMS Spectra of Polymers, Perkin Elmer (in press). 

As mentioned in Sect. 3.1.1, the as-prepared (CH)X film surface is usually oxidized to some extent. Figure 23(a) and Fig. 23(b) show, respectively, the negative static SIMS spectra of a high density cis-(CH)x film before and after sputtering by Ar+ beam [193]. The negative ion spectrum for the as-received film is dominated in the low mass region by signals due to C2H (25 amu), C2... 

Static SIMS Analyses. Static SIMS spectra of PMMA and PET obtained with 2.1013 Xe+/cm2 are presented in Figure 4. They are totally comparable with already published spectra of the same polymers Q, 4, , li). Figure 4 illustrates the greater molecular specificity of static SIMS compared to XPS. 

Figure 4. Static SIMS spectra acquired with less than 2.1013 Xe+/cm2 (a) PMMA and (b) PET...

Previous static SIMS analyses have also shown (2) that the plasma treatment may induce fragmentation of the polymer backbone and some homogeneization of the polypropylene surface composition. Figure 6a shows static SIMS spectra obtained on a virgin polypropylene sample and Figure 6b on polypropylene which was treated in a N2 plasma for 7 seconds. 

An investigation of the oxidative behavior of a silicon surface was conducted with static SIMS. Both the Increase in SiO, intensity during oxidation and the decrease in SIO, intensity during sputter removal of a monomolecular oxide layer were recorded. Negative ion static SIMS spectra were also used to determine the various species present when water is present during the oxidation of the Si surface. (W... 

Before the metallization, static SIMS spectra were recorded on two different areas of the pristine sample to check Che surface cleanliness. For each metallization corresponding to the different deposition times, a new PET substrate was used. After the metallization, two or three different surface areas were examined. The SIMS spectra were transformed into histograms by integrating the secondary ion intensity related Co each integer value of m/g. By this procedure, a very good reproducibility Is obtained with a relative standard deviation on the major peaks lower chan 5%. 

Figure 5. Static SIMS spectra of PTFE film for positive ions, (a) fresh surface, (b) laser-treated surface ( ArF laser 27 mJ cm"2 pulse l, 3000 pulses).

The fingerprint quality of static SIMS spectra has already been noted. Identification of surface species is aided by the existence of an expanding library of static SIMS spectra... 

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