Spectrometry SSIMS

We have undertaken a series of experiments Involving thin film models of such powdered transition metal catalysts (13,14). In this paper we present a brief review of the results we have obtained to date Involving platinum and rhodium deposited on thin films of tltanla, the latter prepared by oxidation of a tltanliua single crystal. These systems are prepared and characterized under well-controlled conditions. We have used thermal desorption spectroscopy (TDS), Auger electron spectroscopy (AES) and static secondary Ion mass spectrometry (SSIMS). Our results Illustrate the power of SSIMS In understanding the processes that take place during thermal treatment of these thin films. Thermal desorption spectroscopy Is used to characterize the adsorption and desorption of small molecules, In particular, carbon monoxide. AES confirms the SSIMS results and was used to verify the surface cleanliness of the films as they were prepared. 

TPD and static secondary ion mass spectrometry (SSIMS) data suggest that methanol dissociatively adsorbs at Ob-vacs and molecularly at the Ti5c sites [52, 53]. There is also some evidence that methanol also dissociates at other sites apart from Ob-vacs, presumably Tisc sites [53-55]. Similar conclusions have been reached for a series of short-chain (C2-C8) aliphatic alcohols [56-58]. 

Surface Chemical Analysis of Polymeric Drug Delivery Systems by Static Secondary Ion Mass Spectrometry (SSIMS) and SIMS Imaging... 

Successfully developing a surface engineering strategy based on surfactant behavior at interfaces requires surface characterization techniques that can validate and quantify surface chemistry changes. This review describes the role of two surface chemistry analysis techniques that have proven highly successful in surfactant analysis x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS). In Section II, the methods by which these techniques analyze surface chemistry are described. In Section III, recent examples of their application in surfactant-based surface engineering are described. 

Lee, P. I. and Good, W. R., Eds. Surface chemical analysis of polymeric drug delivery systems by static secondary ion mass spectrometry (SSIMS) and SIMS imaging. In American Chemical Society Symposium Series Controlled-Release Technology, Pharmaceutical Applications. American Chemical Society, Washington, DC, 1987. 

SSIMS scanning mode secondary ion mass spectrometry... 

A confirmation of the above hypothesis has been provided by static secondary ion mass spectrometry (SSIMS) and x-ray photoelectron spectroscopy (XPS) [64-67]. Ward et al. [67] used atomic ratios from XPS to estimate the thickness of the surface lipid layer as 0.9 nm, which is less than half of that estimated by Negri et al. [42] from the length of a 20-carbon... 

Static secondary ion mass spectrometry (SSIMS) 1976 Atmospheric pressure chemical ionization (APCI) 1976 Thermospray (TSP) 1978 Electrohydrodynamic ionization (EH) 1978 Fast atom bombardment (FAB) 1982 Potassium ionization of desorbed species (KIDS) 1984 Electrospray ionization (ESI) 1984 Multiphoton ionization (MPI) 1987... 

In the present paper. Static Secondary Ion Mass Spectrometry (SSIMS) is used to investigate the interfacial chemistry between vacuum-deposited Al and Cu on PET by following the initial stages of metallization in the submonolayer and monolayer regimes. From the SIMS intensity variations with the deposited metal flux, information on the initial growth mechanisms of the metal layer Is expected. Two metals, copper and aluminum, have been chosen In order to investigate the influence of the metal reactivity on the metal-polymer interface formation. Aluminum with its electropositive sp band is known to react strongly with the carbonyl functionalities of the whereas copper is an inert metal and its Interaction is believed to be much weaker. ... 

There are other spectroscopy methods also available for characterizing silane-coated surfaces such as SSIMS (static secondary ion mass spectrometry), AFM... 

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