SSIMS mass analyzers

The instrumentation for SSIMS can be divided into two parts (a) the primary ion source in which the primary ions are generated, transported, and focused towards the sample and (b) the mass analyzer in which sputtered secondary ions are extracted, mass separated, and detected. 

The basic instrumental set-up for dynamic SIMS is the same as for SSIMS (Sect. 3.1.2). Depending on the intensity, beam diameter, and ion species needed, dif ferent ion sources are used. Several mass analyzers with different characteristics enable a broad field of applications. 

In principle, four types of mass analyzers could be used for SSIMS and SNMS applications ... 

The mass analyzers most commonly used in the SSIMS technique are magnetic sector, quadrupole, and time-of-flight (TOE) analyzers. The TOE analyzer is based on the principle that ions with different mass/charge ratios will travel a fixed path length in different limes, when they are accelerated through the same potential field. The lighter ions travel at a faster velocity and are thus detected before the heavier ions. Compared to the other mass... 

Fig. 3.3. Experimental arrangement used by Krauss and Gruen for SSIMS [3.8] a qua-drupole mass spectrometer was used for mass analysis and a retarding-field analyzer for prior energy selection (a) ion gun (b)-(d) lenses 1-3 (e) quadrupole mass spec-...

Successfully developing a surface engineering strategy based on surfactant behavior at interfaces requires surface characterization techniques that can validate and quantify surface chemistry changes. This review describes the role of two surface chemistry analysis techniques that have proven highly successful in surfactant analysis x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS). In Section II, the methods by which these techniques analyze surface chemistry are described. In Section III, recent examples of their application in surfactant-based surface engineering are described. 

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