SPM software

After the tip is in measurement position, the SPM software directs the controller to send high and low frequency, triangular-wave voltage signals to the V and y electrodes of a tube piezoelectric scanner, respectively, to control the scanning process. Some are multimode microscopes that allow simultaneous measurement of two properties, e.g. topography and current, over the same scan area allowing direct comparison of structure and property. 

Center, San Antonio. SECM data files can also be converted into files that can be read by other commercial SPM instruments. The author wrote a program (available upon request) to convert SECM data hies to Nanoscope (Digital Instruments) format, making all the data analysis and display routines of the commercial software available. 

J. (John) F. Watts received a Ph.D. in materials science from the University of Surrey in England in 1981 and was awarded a D.Sc. in 1997 from the same university. He subsequently returned to an academic position in Adhesion Science at Surrey, where he now heads the Surface and Interface Reaction Group. Current research interests arc concerned with aspects of adhesion and polymer surface treatment, and with the applications of XPS, AES. ToF-SIMS. and SPM to those problems, He is the author of an introductory text and a software package on electron spectroscopy, and has lectured widely in Europe, the United States, and the Far East. 

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