Solid materials characterization

Temperature-Programmed Reduction for Solid Materials Characterization, Alan Jones and Brian McNichol... 

T. H. Tsai, J. W. Lane, and C. S. Lin Temperature-Programmed Reduction for Solid Materials Characterization, Alan Jones and Brian McNichol Catalytic Cracking Catalysts, Chemistry, and Kinetics,... 

A. Jones and B. D. McNicol, Temperature Programmed Reduction for Solid Material Characterization, (Chemical Industries Series, Vol. 24), Dekker, NewYork, 1986. 

Dielectric spectroscopy has proved to be an important tool to describe emulsion and microemulsion systems. Professor Yuri Feldman and his Norwegian colleagues review in Chapter 6 the fundamentals of this technique and its plausible applications. The span of applications is very wide and includes flocculation processes in emulsions, diffusion processes and porosity measurements in solid materials, characterization of particulate biosuspensions, and percolation phenomena in microemulsions. 

Solids can be measured in transmission or reflection (reflectance) modes. Both specular reflection and diffuse reflection are used. Diffuse reflection accessories include the Praying Mantis from Harrick Scientific Products, Inc., and a variety of integrating spheres available from most major instrument companies. Specular reflection is used for highly reflective materials diffuse reflectance for powders and rough surfaced solids. Materials characterization relies heavily on techniques like these. 

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