SiC Nanotubes and Nanofibers

The high-resolution TEM micrograph reveals the presence of a high density of stacking faults along the SiC fiber and also the existence of a thin amorphous layer covering part of the fiber surface (Eig. 7.11C). XPS analysis indicated that the thin amorphous layer was a mixture of Si02 and SiOxCy phases [64]. 

The ID SiC material generally displayed a diameter bigger than the starting carbon parent. This could be attributed to the epitaxial post-growth gas-phase 

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