Self-assembled monolayers , scanning electron transfer

Liu, B., A.J. Bard, M.V. Mirkin, and S.E. Creager. 2004. Electron transfer at self-assembled monolayers measured by scanning electrochemical microscopy. J. Am. Chem. Soc. 126 1485-1492. 

In the two-state approximation (TSA), ET kinetics for the DBA —> D" BA process may be modeled in terms of initial- ( ,) and final-state (T /) wave-functions, in which the transferring charge is localized primarily on the D and A sites, respectively. In the case of electrodes (e.g., metal or semiconductor), where multiple electronic states are involved, the D and A sites may still be taken to be localized and to involve atomic sites of the electrode near the site/or sites of attachment or contact with the bridge) SAM = self assembled monolayer STM = scanning tunneling microsccopy. 

Kiani, A., M. A. Alpuche-Aviles, P. K. Eggers et al. 2008. Scanning electrochemical microscopy. 59. Effect of defects and structure on electron transfer through self-assembled monolayers. Langmuir 24 ... 

FIGURE 5.7 Schematic view of the processes involved in the SECM measurements of ET across an electroactive SAM. (A) Mediated ET, (B) direct electron tunneling through monolayer, and (C) ET through pinholes. (Adapted from Liu, B., Bard, A.J., Mirkin, M.V., and Creager, S.E., Electron transfer at self-assembled monolayers measured by scanning electrochemical microscopy, J. Am. Chem. Soc., 126, 1485-1492, 2004. Copyright 2004 American Chemical Society.)... 

---