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Secondary electron fine structure

SECONDARY ELECTRON FINE STRUCTURE—A METHOD OF LOCAL ATOMIC STRUCTURE CHARACTERIZATION... [Pg.191]

Here, in Volume 38, Advances in Surface Science, we again supplement our treatment of surface science. This volume broadly reviews the current methods of surface characterization and the use of photoelectron spectroscopy. It adds secondary electron fine structure to the arsenal of experimental tools available. Finally, it extends our experimental methods to the domain of organic materials and molecules and to high-pressure systems. [Pg.472]

See other pages where Secondary electron fine structure is mentioned: [Pg.191]    [Pg.195]    [Pg.197]    [Pg.199]    [Pg.201]    [Pg.203]    [Pg.205]    [Pg.207]    [Pg.209]    [Pg.211]    [Pg.213]    [Pg.215]    [Pg.219]    [Pg.223]    [Pg.225]    [Pg.227]    [Pg.231]    [Pg.235]    [Pg.237]    [Pg.239]    [Pg.241]    [Pg.243]    [Pg.245]    [Pg.247]    [Pg.249]    [Pg.253]    [Pg.255]    [Pg.257]    [Pg.259]    [Pg.261]    [Pg.263]    [Pg.265]   


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